典型文献
Direct visualization of structural defects in 2D semiconductors
文献摘要：
Direct visualization of the structural defects in two-dimensional(2D)semiconductors at a large scale plays a sig-nificant role in understanding their electrical/optical/magnetic properties,but is challenging.Although traditional atomic resolution imaging techniques,such as transmission electron microscopy and scanning tunneling microscopy,can directly image the structural defects,they provide only local-scale information and require complex setups.Here,we develop a simple,non-invasive wet etching method to directly visualize the structural defects in 2D semiconductors at a large scale,including both point defects and grain boundaries.Utilizing this method,we extract successfully the defects density in several different types of monolayer molybdenum disulfide samples,providing key insights into the device functions.Fur-thermore,the etching method we developed is anisotropic and tunable,opening up opportunities to obtain exotic edge states on demand.
文献关键词：
中图分类号：
作者姓名：
Yutuo Guo;Qinqin Wang;Xiaomei Li;Zheng Wei;Lu Li;Yalin Peng;Wei Yang;Rong Yang;Dongxia Shi;Xuedong Bai;Luojun Du;Guangyu Zhang
作者机构：
Beijing National Laboratory for Condensed Matter Physics and Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China;School of Physical Science,University of Chinese Academy of Sciences,Beijing 100049,China;Songshan-Lake Materials Laboratory,Dongguan 523808,Guangdong Province,China
文献出处：
引用格式：
[1]Yutuo Guo;Qinqin Wang;Xiaomei Li;Zheng Wei;Lu Li;Yalin Peng;Wei Yang;Rong Yang;Dongxia Shi;Xuedong Bai;Luojun Du;Guangyu Zhang-.Direct visualization of structural defects in 2D semiconductors)[J].中国物理B（英文版）,2022(07):68-72
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B类：
Direct,visualization,structural,defects,2D,semiconductors,two,dimensional,large,scale,plays,nificant,role,understanding,their,electrical,optical,magnetic,properties,but,challenging,Although,traditional,atomic,resolution,imaging,techniques,such,transmission,electron,microscopy,scanning,tunneling,directly,image,they,provide,only,local,information,require,complex,setups,Here,simple,invasive,wet,etching,method,visualize,including,both,point,grain,boundaries,Utilizing,this,extract,successfully,density,several,different,types,monolayer,molybdenum,disulfide,samples,providing,key,insights,into,device,functions,Fur,thermore,developed,anisotropic,tunable,opening,opportunities,obtain,exotic,edge,states,demand
AB值：
0.673152
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