Siqi Yan;Yan Zuo;Sanshui Xiao;Leif Katsuo Oxenl?we;Yunhong Ding-DTU Electro,Department of Electrical and Photonics Engineering,Technical University of Denmark,Kgs.Lyngby DK-2800,Denmark;School of Optical and Electrical Information and Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China.

Eric Tournié;Laura Monge Bartolome;Marta Rio Calvo;Zeineb Loghmari;Daniel A.Díaz-Thomas;Roland Teissier;Alexei N.Baranov;Laurent Cerutti;Jean-Baptiste Rodriguez-IES,University of Montpellier,CNRS,34000 Montpellier,France

Chengli Wang;Jin Li;Ailun Yi;Zhiwei Fang;Liping Zhou;Zhe Wang;Rui Niu;Yang Chen;Jiaxiang Zhang;Ya Cheng;Junqiu Liu;Chun-Hua Dong;Xin Ou-State Key Laboratory of Functional Materials for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,200050 Shanghai,China;The Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,100049 Beijing,China;CAS Key Laboratory of Quantum Information,University of Science and Technology of China,230026 Hefei,China;CAS Center for Excellence in Quantum Information and Quantum Physics,University of Science and Technology of China,230026 Hefei,China;The Extreme Optoelectromechanics Laboratory(XXL),School of Physics and Electronic Science,East China Normal University,200241 Shanghai,China;State Key Laboratory of High Field Laser Physics and CAS Center for Excellence in Ultra-intense Laser Science,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,201800 Shanghai,China;International Quantum Academy,518048 Shenzhen,China;Hefei National Laboratory,University of Science and Technology of China,Hefei 230026,China

HAYK GEVORGYAN;ANATOL KHILO;MARK T.WADE;VLADIMIR M.STOJANOVI?;MILO? A.POPOVI?-Department of Electrical and Computer Engineering,Boston University,Boston,Massachusetts 02215,USA;Ayar Labs Inc.,Emeryville,California 94608,USA;Department of Electrical Engineering and Computer Sciences,University of California Berkeley,Berkeley,California 94709,USA

YONGHUA WANG;Su HE;XIAOYAN GAO;PIAOPIAO YE;LEI LEI;WENCHAN DONG;XINLIANG ZHANG;PING XU-College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China;School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China

Weiqiang Xie;Chao Xiang;Lin Chang;Warren Jin;Jonathan Peters;John E. Bowers-Department of Electrical and Computer Engineering, University of California, Santa Barbara, Santa Barbara, California 93106, USA;Current address: Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai 200240, China

GAEHUN JO;PIERRE EDINGER;SIMON J.BLEIKER;XIAOJING WANG;ALAIN YUJI TAKABAYASHI;HAMED SATTARI;NIELS QUACK;MOISES JEZZINI;JUN SU LEE;PETER VERHEYEN;IMAN ZAND;UMAR KHAN;WIM BOGAERTS;G?RAN STEMME;KRISTINN B.GYLFASON;FRANK NIKLAUS-Division of Micro and Nanosystems,KTH Royal Institute of Technology,11428 Stockholm,Sweden;école Polytechnique Fédérale de Lausanne(EPFL),1015 Lausanne,Switzerland;Tyndall National Institute,Lee Maltings Complex Dyke Parade,T12 R5CP Cork,Ireland;imec vzw.3DSIP Department,Si Photonics Group,Kapeldreef 75,3001 Leuven,Belgium;Department of Information Technology,Photonics Research Group,Ghent University-IMEC,9052 Gent,Belgium

WEIQIANG XIE;CHAO XIANG;LIN CHANG;WARREN JIN;JONATHAN PETERS;JOHN E.BOWERS-Department of Electrical and Computer Engineering,University of California,Santa Barbara,Santa Barbara,California 93106,USA;Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China

ZHUOHUI YANG;ZHENGQING DING;LIN LIU;HANCHENG ZHONG;SHENG CAO;XINZHONG ZHANG;SHIZHE LIN;XIAOYING HUANG;HUADI DENG;YING YU;SIYUAN YU-State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-sen University,Guangzhou 510275,China

CHAO XIANG;WARREN JIN;JOHN E.BOWERS-Department of Electrical and Computer Engineering,University of California,Santa Barbara,Santa Barbara,California 93106,USA

XIANGWEN GUO;LINBO SHAO;LINGYAN HE;KEVIN LUKE;JESSE MORGAN;KEYE SUN;JUNYI GAO;TA-CHING TZU;YANG SHEN;DEKANG CHEN;BINGTIAN GUO;FENGXIN YU;QIANHUAN YU;MASOUD JAFARI;MARKO LON?AR;MIAN ZHANG;ANDREAS BELING-Department of Electrical and Computer Engineering,University of Virginia,Charlottesville,Virginia 22903,USA;John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,Massachusetts 02138,USA;HyperLight Corporation,Cambridge,Massachusetts 02139,USA

JIACHEN LI;SIGANG YANG;HONGWEI CHEN;XINGJUN WANG;MINGHUA CHEN;WEIWEN ZOU-Beijing National Research Center for Information Science and Technology(BNRist),Department of Electronic Engineering,Tsinghua University,Beijing 100084,China;State Key Laboratory of Advanced Optical Communications System and Networks,Department of Electronics,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,Intelligent Microwave Lightwave Integration Innovation Center(imLic),Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China

Xiaobin Liu;Xuetong Li;Yuxuan Li;Yingzhi Li;Zihao Zhi;Min Tao;Baisong Chen;Lanxuan Zhang;Pengfei Guo;Guoqiang Lo;Xueyan Li;Fengli Gao;Bonan Kang;Junfeng Song-State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China;Advance Micro Foundry Pte Ltd, Singapore 117685, Singapore;Peng Cheng Laboratory, Shenzhen 518000, China

XIAOBIN LIU;XUETONG LI;YUXUAN LI;YINGZHI LI;ZIHAO ZHI;MIN TAO;BAISONG CHEN;LANXUAN ZHANG;PENGFEI GUO;GUOQIANG LO;XUEYAN LI;FENGLI GAO;BONAN KANG;JUNFENG SONG-State Key Laboratory of Integrated Optoelectronics,College of Electronic Science and Engineering,Jilin University,Changchun 130012,China;Advance Micro Foundry Pte Ltd,Singapore 117685,Singapore;Peng Cheng Laboratory,Shenzhen 518000,China

NING LIU;XIAOHONG YAN;LONG GAO;SERGEY BELOSHAPKIN;CHRISTOPHE SILIEN;HONG WEI-Department of Physics,University of Limerick,Limerick,Ireland;Bemal Institute,University of Limerick,Limerick,Ireland;Beijing National Laboratory for Condensed Matter Physics,Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China;School of Physical Sciences,University of Chinese Academy of Sciences,Beijing 100049,China

Yaocheng Shi;Yong Zhang;Yating Wan;Yu Yu;Yuguang Zhang;Xiao Hu;Xi Xiao;Hongnan Xu;Long Zhang;Bingcheng Pan-Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Zijingang Campus, Hangzhou 310058, China;State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai 200240, China;Institute for Energy Efficiency, University of California Santa Barbara, Santa Barbara, California 93106, USA;Electrical and Computer Engineering Department, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia;Wuhan National Laboratory for Optoelectronics & School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China;National Information Optoelectronics Innovation Center, China Information and Communication Technologies Group Corporation (CICT), Wuhan 430074, China;State Key Laboratory of Optical Communication Technologies and Networks, China Information and Communication Technologies Group Corporation (CICT), Wuhan 430074, China;Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong, China

YAOCHENG SHI;YONG ZHANG;YATING WAN;YU YU;YUGUANG ZHANG;XIAO HU;XI XIAO;HONGNAN XU;LONG ZHANG;BINGCHENG PAN-Centre for Optical and Electromagnetic Research,State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,Zhejiang University,Zijingang Campus,Hangzhou 310058,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China;Institute for Energy Efficiency,University of California Santa Barbara,Santa Barbara,California 93106,USA;Electrical and Computer Engineering Department,King Abdullah University of Science and Technology(KAUST),Thuwal 23955-6900,Saudi Arabia;Wuhan National Laboratory for Optoelectronics&School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;National Information Optoelectronics Innovation Center,China Information and Communication Technologies Group Corporation(CICT),Wuhan 430074,China;State Key Laboratory of Optical Communication Technologies and Networks,China Information and Communication Technologies Group Corporation(CICT),Wuhan 430074,China;Department of Electronic Engineering,The Chinese University of Hong Kong,Shatin,New Territories,Hong Kong,China

RANJAN DAS;YANRAN XIE;HENRY FRANKIS;KERU CHEN;HERMANN RUFENACHT;GUILLAUME LAMONTAGNE;JONATHAN D.B.BRADLEY;ANDREW P.KNIGHTS-Department of Engineering Physics,McMaster University,Hamilton,Ontario L8S 4L7,Canada;McDonald Detwiler Associates,Sainte-Anne-de-Bellevue,Quebec H9X 3R2,Canada

Zihan Tao;Bo Wang;Bowen Bai;Ruixuan Chen;Haowen Shu;Xuguang Zhang;Xingjun Wang-State Key Laboratory of Advanced Optical Communication Systems and Networks,School of Electronics,Peking University,Beijing 100871,China;Frontier Science Center for Nano-Optoelectronics,Peking University,Beijing 100871,China;Peking University Yangtze Delta Institute of Optoelectronics,Nantong 226010,China;Peng Cheng Laboratory,Shenzhen 518055,China

Jeremy C.Adcock;Yunhong Ding-Center for Silicon Photonics for Optical Communication,Technical University of Denmark,2800 Kgs.Lyngby,Denmark