Yuan Yuan;Bassem Tossoun;Zhihong Huang;Xiaoge Zeng;Geza Kurczveil;Marco Fiorentino;Di Liang;Raymond G.Beausoleil-Hewlett Packard Labs,Hewlett Packard Enterprise,Milpitas,CA 95035,USA

Shanshan Chen;Yongyue Zhang;Xiaorong Hong;Jiafang Li-Key Laboratory for Microstructural Material Physics of Hebei Province,School of Science,Yanshan University,Qinhuangdao 066004,China;Key Laboratory of Advanced Optoelectronic Quantum Architecture and Measurement(Ministry of Education),Beijing Key Laboratory of Nanophotonics&Ultrafine Optoelectronic Systems,and School of Physics,Beijing Institute of Technology,Beijing 100081,China;Yangtze Delta Region Academy of Beijing Institute of Technology,Jiaxing 314019,China

Siqi Yan;Yan Zuo;Sanshui Xiao;Leif Katsuo Oxenl?we;Yunhong Ding-DTU Electro,Department of Electrical and Photonics Engineering,Technical University of Denmark,Kgs.Lyngby DK-2800,Denmark;School of Optical and Electrical Information and Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China.

Syed Afaq Ali Shah;Muhammad Hassan Sayyad;Jinghua Sun;Zhongyi Guo-School of Electrical Engineering&Intelligentization,Dongguan University of Technology,Dongguan 523808,China;Advanced Photovoltaic Research Labs(APRL),Faculty of Engineering Sciences,Ghulam Ishaq Khan Institute of Engineering Sciences and Technology,Topi,District Swabi,Khyber,Pakhtunkhwa,23640,Pakistan;School of Computer and Information,Hefei University of Technology,Hefei 230009,China

Nan Xu;Chun Wang;Liuquan Yang;Eric Kumi Barimah;Gin Jose;Anne Neville;Ardian Morina-Institute of Functional Surfaces,School of Mechanical Engineering,University of Leeds,Leeds,LS2 9JT,United Kingdom;School of Chemical and Process Engineering,University of Leeds,Leeds,LS2 9JT,United Kingdom

Shunliang Gao;Xiaohui Zhao;Qi Fu;Tianchi Zhang;Jun Zhu;Fuhua Hou;Jian Ni;Chengjun Zhu;Tiantian Li;Yanlai Wang;Vignesh Murugadoss;Gaber A.M.Mersal;Mohamed M.Ibrahim;Zeinhom M.El-Bahy;Mina Huang;Zhanhu Guo-The Key Laboratory of Semiconductor Photovoltaic Technology at Universities of Inner Mongolia Autonomous Region,College of Physical Science and Technology,Inner Mongolia University,Hohhot 010021,China;Department of Electronic Science and Technology,School of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China;Advanced Materials Division,Engineered Multifunctional Composites(EMC)Nanotech LLC,Knoxville,TN 37934,United States;Integrated Composites Laboratory(ICL),Department of Chemical and Bimolecular Engineering,University of Tennessee,Knoxville,TN 37996,United States;Department of Chemistry,College of Science,Taif University,P.O.Box 11099,Taif 21944,Saudi Arabia;Department of Chemistry,Faculty of Science,Al-Azhar University,Nasr City 11884,Cairo,Egypt;College of Materials Science and Engineering,Taiyuan University of Science and Technology,Taiyuan 030024,China

Zhaogang Dong;Zackaria Mahfoud;Ramón Paniagua-Domínguez;Hongtao Wang;Antonio I.Fernández-Domínguez;Sergey Gorelik;Son Tung Ha;Febiana Tjiptoharsono;Arseniy I.Kuznetsov;Michel Bosman;Joel K.W.Yang-Institute of Materials Research and Engineering,A*STAR(Agency for Science,Technology and Research),2 Fusionopolis Way,#08-03 Innovis,138634 Singapore,Singapore;Department of Materials Science and Engineering,National University of Singapore,9 Engineering Drive 1,117575 Singapore,Singapore;Singapore University of Technology and Design,8 Somapah Road,487372 Singapore,Singapore;Departamento de Física Teórica de la Materia Condensada and Condensed Matter Physics Center,Universidad Autónoma de Madrid,28049 Madrid,Spain;Singapore Institute of Food and Biotechnology Innovation,A*STAR(Agency for Science,Technology and Research),31 Biopolis Way,#01-02 Nanos,138669 Singapore,Singapore

Ruijuan Tian;Xuetao Gan;Chen Li;Xiaoqing Chen;Siqi Hu;Linpeng Gu;Dries Van Thourhout;Andres Castellanos-Gomez;Zhipei Sun;Jianlin Zhao-Key Laboratory of Light Field Manipulation and Information Acquisition,Ministry of Industry and Information Technology,and Shaanxi Key Laboratory of Optical Information Technology,School of Physical Science and Technology,Northwestern Polytechnical University,710129 Xi'an,China;Photonics Research Group and Center for Nano and Biophotonics,Ghent University,B-9000 Gent,Belgium;Materials Science Factory,Instituto de Ciencia de Materiales de Madrid(ICMM-CSIC),E-28049 Madrid,Spain;Department of Electronics and Nanoengineering and QTF Centre of Excellence,Aalto University,Fl-02150 Espoo,Finland

Jinlong Xiang;Zhiyuan Tao;Xingfeng Li;Yaotian Zhao;Yu He;Xuhan Guo;Yikai Su-State Key Laboratory of Advanced Optical Communication Systems and Networks,Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China

Yachao Liu;Guo Ping Wang;John B.Pendry;Shuang Zhang-College of Electronics and Information Engineering,Shenzhen University,518060 Shenzhen,China;School of Physics&Astronomy,University of Birmingham,Birmingham B15 2TT,UK;The Blackett Laboratory,Department of Physics,Imperial College London,London SW7 2AZ,UK;Department of Physics,University of Hong Kong,Hong Kong,China;Department of Electrical&Electronic Engineering,University of Hong Kong,Hong Kong,China

Rusnè lva?kevi?iūtè-Povilauskienè;Paulius Kizevi?ius;Ernestas Nacius;Domas Jokubauskis;K?stutis lkamas;Alvydas Lisauskas;Natalia Alexeeva;leva Matulaitienè;Vytautas Jukna;Sergej Orlov;Linas Minkevi?ius;Gintaras Valu?is-Department of Optoelectronics,Center for Physical Sciences and Technology,Sauletekio av.3,Vilnius 10257,Lithuania;Department of Fundamental Research,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Applied Electrodynamics&Telecommunications,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania;CENTERA Labs.,Institute of High Pressure Physics PAS,ul.Sokolowska 29/37,Warsaw 01-142,Poland;Department of Organic Chemistry,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Photonics and Nanotechnology,Department of Physics,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania

Zhaoqing Li;Olivier Allegre;Lin Li-Department of Mechanical,Aerospace and Civil Engineering,The University of Manchester,Manchester M13 9PL,UK

Chengli Wang;Jin Li;Ailun Yi;Zhiwei Fang;Liping Zhou;Zhe Wang;Rui Niu;Yang Chen;Jiaxiang Zhang;Ya Cheng;Junqiu Liu;Chun-Hua Dong;Xin Ou-State Key Laboratory of Functional Materials for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,200050 Shanghai,China;The Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,100049 Beijing,China;CAS Key Laboratory of Quantum Information,University of Science and Technology of China,230026 Hefei,China;CAS Center for Excellence in Quantum Information and Quantum Physics,University of Science and Technology of China,230026 Hefei,China;The Extreme Optoelectromechanics Laboratory(XXL),School of Physics and Electronic Science,East China Normal University,200241 Shanghai,China;State Key Laboratory of High Field Laser Physics and CAS Center for Excellence in Ultra-intense Laser Science,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,201800 Shanghai,China;International Quantum Academy,518048 Shenzhen,China;Hefei National Laboratory,University of Science and Technology of China,Hefei 230026,China

Hongxiang Zhang;Changpei Liang;Jian Song;Chenzhong Fu;Xiaofei Zang;Lin Chen;Jingya Xie-Terahertz Technology Innovation Research Institute,Terahertz Spectrum and Imaging Technology Cooperative Innovation Center,Shanghai Key Laboratory of Modern Optical System,University of Shanghai for Science and Technology,Shanghai 200093,China;Shanghai Institute of Intelligent Science and Technology,Tongji University,Shanghai 200092,China

Junhu Zhou;Jie You;Hao Ouyang;Runlin Miao;Xiang'ai Cheng;Tian Jiang-College of Advanced Interdisciplinary Studies,National University of Defense Technology,Changsha 410073,China;Defense Innovation Institute,Academy of Military Sciences PLA China,Beijing 100071,China;Beijing Institute for Advanced Study,National University of Defense Technology,Beijing 100020,China

Aviv Karnieli;Yongyao Li;Ady Arie-Raymond and Beverly Sackler School of Physics and Astronomy,Tel Aviv University,Ramat Aviv 69978,Tel Aviv,Israel;School of Physics and Optoelectronic Engineering,Foshan University,Foshan 528000,China;School of Electrical Engineering,Fleischman Faculty of Engineering,Tel Aviv University,Tel Aviv,Israel

Xiao-Hui Li;Yi-Xuan Guo;Yujie Ren;Jia-Jun Peng;Ji-Shu Liu;Cong Wang;Han Zhang-School of Physics & Information Technology,Shaanxi Normal University,Xi'an 710119,China;Shenzhen Key Laboratory of Two-Dimensional Materials and Devices/Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics,Collaborative Innovation Center for Optoelectronic Science and Technology,Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong,Shenzhen 518060,China

Shengping Liu;Junbo Feng;Ye Tian;Heng Zhao;Li Jin;Boling Ouyang;Jiguang Zhu;Jin Guo-Chongqing United Microelectronics Center,Chongqing 401332,China

Jeremy C.Adcock;Yunhong Ding-Center for Silicon Photonics for Optical Communication,Technical University of Denmark,2800 Kgs.Lyngby,Denmark

Boqing Zhang;Nuo Chen;Xinda Lu;Yuntian Chen;Xinliang Zhang;Jing Xu-School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China