Zifei Yan;Jiaxin Tian;Chencan Du;Jian Deng;Guangsheng Luo-The State Key Lab of Chemical Engineering,Department of Chemical Engineering,Tsinghua University,Beijing 100084,China

Huixin DONG;Wei KUANG;Fei XIAO;Lihai LIU;Feng XIANG;Wei WANG;Jianhua HE-School of Electronic Information and Communication,Huazhong University of Science and Technology,Wuhan 430074,China;School of Management,Huazhong University of Science and Technology,Wuhan 430074,China;China Railway Siyuan Survey and Design Group Co.,Ltd.,Wuhan 430063,China;Wuhan Maritime Communication Research Institute,Wuhan 430079,China;School of Computer Science and Electronic Engineering,University of Essex,Colchester CO43SQ,UK

Sutapa SARKAR;Biplab Kumar SIKDAR;Mousumi SAHA-Department of Electronics and Communication Engineering,Seacom Engineering College,Howrah,West Bengal 711302,India;Department of Computer Science and Technology,Indian Institute of Engineering Science and Technology,Howrah,West Bengal 711103,India;Department of Computer Science and Engineering,National Institute of Technology,Durgapur,West Bengal 713209,India

Long Wen;Xianghong Nan;Jiaxiang Li;David R.S.Cumming;Xin Hu;Qin Chen-Institute of Nanophotonics,Jinan University,Guangzhou 511443,China;James Watt School of Engineering,University of Glasgow,Glasgow G128QQ,UK;Hangzhou Dianzi University,Hangzhou 310018,China

Arnaldo Leal-Junior;Leticia Avellar;Vitorino Biazi;M.Simone Soares;Anselmo Frizera;Carlos Marques-Graduate Program in Electrical Engineering,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;Mechanical Engineering Department,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;I3N&Physics Department,University of Aveiro,Aveiro 3810-193,Portugal

Shunliang Gao;Xiaohui Zhao;Qi Fu;Tianchi Zhang;Jun Zhu;Fuhua Hou;Jian Ni;Chengjun Zhu;Tiantian Li;Yanlai Wang;Vignesh Murugadoss;Gaber A.M.Mersal;Mohamed M.Ibrahim;Zeinhom M.El-Bahy;Mina Huang;Zhanhu Guo-The Key Laboratory of Semiconductor Photovoltaic Technology at Universities of Inner Mongolia Autonomous Region,College of Physical Science and Technology,Inner Mongolia University,Hohhot 010021,China;Department of Electronic Science and Technology,School of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China;Advanced Materials Division,Engineered Multifunctional Composites(EMC)Nanotech LLC,Knoxville,TN 37934,United States;Integrated Composites Laboratory(ICL),Department of Chemical and Bimolecular Engineering,University of Tennessee,Knoxville,TN 37996,United States;Department of Chemistry,College of Science,Taif University,P.O.Box 11099,Taif 21944,Saudi Arabia;Department of Chemistry,Faculty of Science,Al-Azhar University,Nasr City 11884,Cairo,Egypt;College of Materials Science and Engineering,Taiyuan University of Science and Technology,Taiyuan 030024,China

Yan Zhang;Shihai Miao;Yanjie Liang;Chao Liang;Dongxun Chen;Xihui Shan;Kangning Sun;Xiao-Jun Wang-Key Laboratory for Liquid-Solid Structure Evolution and Processing of Materials,Ministry of Education,Shandong University,Jinan 250061,China;Jiangsu Bree Optronics Co.,Ltd,Nanjing 211103,China;Department of Physics,Georgia Southern University,Statesboro,GA 30460,USA

Yuanpeng Wu;Yixin Xiao;Ishtiaque Navid;Kai Sun;Yakshita Malhotra;Ping Wang;Ding Wang;Yuanxiang Xu;Ayush Pandey;Maddaka Reddeppa;Walter Shin;Jiangnan Liu;Jungwook Min;Zetian Mi-Department of Electrical Engineering and Computer Science,University of Michigan,Ann Arbor,MI 48109,USA;Department of Materials Science and Engineering,University of Michigan,Ann Arbor,MI 48109,USA

Long Gao;Yilin Zhang;Lijie Gou;Qian Wang;Meng Wang;Weitao Zheng;Yinghui Wang;Hin-Lap Yip;Jiaqi Zhang-College of Materials Science and Engineering,Key Laboratory of Automobile Materials,Ministry of Education,Jilin University,Changchun 130012,China;Femtosecond Laser laboratory,Key Laboratory of Physics and Technology for Advanced Batteries,Ministry of Education,College of Physics,Jilin University,Changchun 130012,China;Department of Materials Science and Engineering,City University of Hong Kong,Kowloon,Hong Kong,China;School of Energy and Environment,City University of Hong Kong,Kowloon,Hong Kong,China;Hong Kong Institute for Clean Energy,City University of Hong Kong,Kowloon,Hong Kong,China

BEGA KARADZA;HANNES VAN AVERMAET;LEILA MINGABUDINOVA;ZEGER HENS;YOURI MEURET-KU Leuven,Department of Electrical Engineering(ESAT),Light&Lighting Laboratory,Gebroeders De Smetstraat 1,9000 Gent,Belgium;Physics and Chemistry of Nanostructures and Center for Nano and Biophotonics,Krijgslaan 281-S3,9000 Gent,Belgium

QIAN XIONG;SIHAO HUANG;ZIJUN ZHAN;JUAN DU;XIAOSHENG TANG;ZHIPING HU;ZHENGZHENG LIU;ZEYU ZHANG;WEIWEI CHEN;YUXIN LENG-State Key Laboratory of High Field Laser Physics and CAS Center for Excellence in Ultra-intense Laser Science,Shanghai Institute of Optics and Fine Mechanics(SIOM),Chinese Academy of Sciences(CAS),Shanghai 201800,China;Hangzhou Institute for Advanced Study,University of Chinese Academy of Sciences,Hangzhou 310024,China;School of Physical Science and Technology,ShanghaiTech University,Shanghai 201210,China;Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;School of Physics and Electronics,Shandong Normal University,Jinan 250014,China;College of Optoelectronic Engineering,Chongqing University of Post and Telecommunications,Chongqing 400065,China

A.PANDEY;Y.MALHOTRA;P.WANG;K.SUN;X.LIU;Z.MI-Department of Electrical Engineering and Computer Science,University of Michigan,Ann Arbor,Michigan 48109,USA;Department of Materials Science and Engineering,University of Michigan,Ann Arbor,Michigan 48109,USA

JIACHEN LI;SIGANG YANG;HONGWEI CHEN;XINGJUN WANG;MINGHUA CHEN;WEIWEN ZOU-Beijing National Research Center for Information Science and Technology(BNRist),Department of Electronic Engineering,Tsinghua University,Beijing 100084,China;State Key Laboratory of Advanced Optical Communications System and Networks,Department of Electronics,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,Intelligent Microwave Lightwave Integration Innovation Center(imLic),Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China

Shijie Zhu;Pengjiang Qiu;Xinyi Shan;Runze Lin;Zhou Wang;Zuxin Jin;Xugao Cui;Guoqi Zhang;Pengfei Tian-Institute for Electric Light Sources, School of Information Science and Technology, Academy of Engineering and Technology, Yiwu Research Institute, Fudan University, Shanghai 200433, China

SHIJIE ZHU;PENGJIANG QIU;XINYI SHAN;RUNZE LIN;ZHOU WANG;ZUXIN JIN;XUGAO CUI;GUOQI ZHANG;PENGFEI TIAN-Institute for Electric Light Sources,School of Information Science and Technology,Academy of Engineering and Technology,Yiwu Research Institute,Fudan University,Shanghai 200433,China

JIANYANG SHI;ZENGYI XU;WENQING NIU;DONG LI;XIAOMING WU;ZIWEI LI;JUNWEN ZHANG;CHAO SHEN;GUANGXU WANG;XIAOLAN WANG;JIANLI ZHANG;FENGYI JIANG;SHAOHUA YU;NAN CHI-Key Laboratory for Information Science of Electromagnetic Waves(MoE),Fudan University,Shanghai 200433,China;Shanghai Engineering Research Center of Low-Earth-Orbit Satellite Communication and Applications,Shanghai 200433,China;Shanghai Collaborative Innovation Center of Low-Earth-Orbit Satellite Communication Technology,Shanghai 200433,China;National Institute of LED on Silicon Substrate,Nanchang University,Nanchang 330096,China;Peng Cheng Laboratory,Shenzhen 518055,China

NAVID BANI HASSAN;FAHIMEH DEHKHODA;ENYUAN XIE;JOHANNES HERRNSDORF;MICHAEL J.STRAIN;ROBERT HENDERSON;MARTIN D.DAWSON-Institute of Photonics,Department of Physics,University of Strathclyde,Technology and Innovation Centre,Glasgow G1 1RD,UK;School of Engineering,Institute for Integrated Micro and Nano Systems,University of Edinburgh,Edinburgh EH9 3JL,UK

A.PANDEY;J.MIN;Y.MALHOTRA;M.REDDEPPA;Y.XIAO;Y.WU;Z.MI-Department of Electrical Engineering and Computer Science,University of Michigan,Ann Arbor,Michigan 48109,USA

Jinghui Li;Longbo Yang;Qingxun Guo;Peipei Du;Liang Wang;Xue Zhao;Nian Liu;Xuke Yang;Jiajun Luo;Jiang Tang-Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Optics Valley Laboratory,Wuhan 430074,China;State Key Laboratory of Materials Processing and Die & Mould Technology,School of Materials Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China

Dingshan Gao;Zhiping Zhou-Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,School of Electronics,Peking University,Beijing 100871,China