典型文献
Dark current modeling of thick perovskite X-ray detectors
文献摘要：
Metal halide perovskites(MHPs)have demonstrated excellent performances in detection of X-rays and gamma-rays.Most studies focus on improving the sensitivity of single-pixel MHP detectors.However,little work pays attention to the dark cur-rent,which is crucial for the back-end circuit integration.Herein,the requirement of dark current is quantitatively evaluated as low as 10-9 A/cm2 for X-ray imagers integrated on pixel circuits.Moreover,through the semiconductor device analysis and simulation,we reveal that the main current compositions of thick perovskite X-ray detectors are the thermionic-emission current(JT)and the generation-recombination current(Jg-r).The typical observed failures of p-n junctions in thick detectors are caused by the high generation-recombination current due to the band mismatch and interface defects.This work provides a deep insight into the design of high sensitivity and low dark current perovskite X-ray detectors.
文献关键词：
中图分类号：
作者姓名：
Shan Zhao;Xinyuan Du;Jincong Pang;Haodi Wu;Zihao Song;Zhiping Zheng;Ling Xu;Jiang Tang;Guangda Niu
作者机构：
Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Optical Valley Laboratory,Wuhan 430074,China
文献出处：
引用格式：
[1]Shan Zhao;Xinyuan Du;Jincong Pang;Haodi Wu;Zihao Song;Zhiping Zheng;Ling Xu;Jiang Tang;Guangda Niu-.Dark current modeling of thick perovskite X-ray detectors)[J].光电子前沿（英文版）,2022(04):18-28
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0.596104
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