首站-论文投稿智能助手
典型文献
Deep learning-based scattering removal of light field imaging
文献摘要:
Light field imaging has shown significance in research fields for its high-temporal-resolution 3D imaging ability.However,in scenes of light field imaging through scattering,such as biological imaging in vivo and imaging in fog,the quality of 3D reconstruction will be severely reduced due to the scattering of the light field information.In this paper,we propose a deep learning-based method of scattering removal of light field imaging.In this method,a neural network,trained by simulation samples that are generated by light field imaging forward models with and without scattering,is utilized to remove the effect of scattering on light fields captured experimentally.With the deblurred light field and the scattering-free forward model,3D reconstruction with high resolution and high contrast can be realized.We demonstrate the proposed method by using it to realize high-quality 3D reconstruction through a single scattering layer experimentally.
文献关键词:
作者姓名:
Weihao Wang;Xing Zhao;Zhixiang Jiang;Ya Wen
作者机构:
Institute of Modern Optics,Nankai University,Tianjin 300350,China;Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology,Tianjin 300350,China
引用格式:
[1]Weihao Wang;Xing Zhao;Zhixiang Jiang;Ya Wen-.Deep learning-based scattering removal of light field imaging)[J].中国光学快报(英文版),2022(04):16-22
A类:
deblurred
B类:
Deep,learning,scattering,removal,light,imaging,Light,has,shown,significance,research,fields,its,high,temporal,resolution,ability,However,scenes,through,such,biological,vivo,fog,quality,reconstruction,will,be,severely,reduced,due,information,In,this,paper,deep,method,neural,network,trained,by,simulation,samples,that,are,generated,forward,models,without,utilized,remove,effect,captured,experimentally,With,free,contrast,realized,We,demonstrate,proposed,using,single,layer
AB值:
0.474066
相似文献
Terahertz structured light:nonparaxial Airy imaging using silicon diffractive optics
Rusnè lva?kevi?iūtè-Povilauskienè;Paulius Kizevi?ius;Ernestas Nacius;Domas Jokubauskis;K?stutis lkamas;Alvydas Lisauskas;Natalia Alexeeva;leva Matulaitienè;Vytautas Jukna;Sergej Orlov;Linas Minkevi?ius;Gintaras Valu?is-Department of Optoelectronics,Center for Physical Sciences and Technology,Sauletekio av.3,Vilnius 10257,Lithuania;Department of Fundamental Research,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Applied Electrodynamics&Telecommunications,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania;CENTERA Labs.,Institute of High Pressure Physics PAS,ul.Sokolowska 29/37,Warsaw 01-142,Poland;Department of Organic Chemistry,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Photonics and Nanotechnology,Department of Physics,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania
Mid-infrared active metasurface based on Si/VO2 hybrid meta-atoms
TONGTONG KANG;BOYU FAN;JUN QIN;WEIHAO YANG;SHUANG XIA;ZHENG PENG;BO LIU;SUI PENG;XIAO LIANG;TINGTING TANG;LONGJIANG DENG;YI LUO;HANBIN WANG;QIANG ZHOU;LEI BI-National Engineering Research Center of Electromagnetic Radiation Control Materials,University of Electronic Science and Technology of China,Chengdu 610054,China;State Key Laboratory of Electronic Thin-Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China;Institute of Fundamental and Frontier Sciences,University of Electronic Science and Technology of China,Chengdu 610054,China;College of Optoelectronic Engineering,Chengdu University of Information Technology,Chengdu 610225,China;State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization,Panzhihua 617000,China;Microsystem&Terahertz Research Center,China Academy of Engineering Physics(CAEP),Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics(CAEP),Mianyang 621900,China
High-frequency enhanced response based on Sb2Te3 topological insulators
SHI ZHANG;CHAOFAN SHI;WEIWEI TANG;LIBO ZHANG;LI HAN;CHENGSEN YANG;ZHENGYANG ZHANG;JIAN WANG;MIAO CAI;GUANHAI LI;CHANGLONG LIU;LIN WANG;XIAOSHUANG CHEN;WEI LU-College of Physics and Optoelectronic Engineering,Hangzhou Institute for Advanced Study,University of Chinese Academy of Sciences,Hangzhou 310024,China;State Key Laboratory of Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China;Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China;Department of Optoelectronic Science and Engineering,Donghua University,Shanghai 201620,China;Terahertz Technology Innovation Research Institute,Shanghai Key Laboratory of Modern Optical System,University of Shanghai for Science and Technology,Shanghai 200093,China
机标中图分类号,由域田数据科技根据网络公开资料自动分析生成,仅供学习研究参考。