Kaixuan Chen;Gengxin Chen;Ziliang Ruan;Xuancong Fan;Junwei Zhang;Ranfeng Gan;Jie Liu;Daoxin Dai;Changjian Guo;Liu Liu-Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center,Guangzhou 510006,China;National Center for International Research on Green Optoelectronics,South China Normal University,Guangzhou 510006,China;State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Hangzhou 310058,China;State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-Sen University,Guangzhou 510006,China;Jiaxing Key Laboratory of Photonic Sensing & Intelligent Imaging,Intelligent Optics & Photonics Research Center,Jiaxing Research Institute,Zhejiang University,Jiaxing 314000,China

Zhongjin Lin;Yanmei Lin;Hao Li;Mengyue Xu;Mingbo He;Wei Ke;Heyun Tan;Ya Han;Zhaohui Li;Dawei Wang;X.Steve Yao;Songnian Fu;Siyuan Yu;Xinlun Cai-State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-sen University,510275 Guangzhou,China;Department of Electrical and Computer Engineering,The University of British Columbia,Vancouver,BC V6T 1Z4,Canada;Photonics Information Innovation Center and Hebei Provincial Center for Optical Sensing Innovations,College of Physics Science and Technology,Hebei University,071002 Baoding,China;Institute of Advanced Photonics Technology,School of Information Engineering,Guangdong University of Technology,510006 Guangzhou,China

Lei Wan;Zhiqiang Yang;Wenfeng Zhou;Meixun Wen;Tianhua Feng;Siqing Zeng;Dong Liu;Huan Li;Jingshun Pan;Ning Zhu;Weiping Liu;Zhaohui Li-Department of Electronic Engineering,College of Information Science and Technology,Jinan University,510632 Guangzhou,China;Guangdong Provincial Key Laboratory of Optoelectronic Information Processing Chips and Systems,Sun Yat-sen University,510275 Guangzhou,China;State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Zijingang Campus,310058 Hangzhou,China;Institute of Semiconductor Science and Technology,Guangdong Engineering Technology Research Center of Low Carbon and New Energy Materials,South China Normal University,510631 Guangzhou,China;Southern Marine Science and Engineering Guangdong Laboratory(Zhuhai),519000 Zhuhai,China

Zefeng Xu;Baoshan Tang;Xiangyu Zhang;Jin Feng Leong;Jieming Pan;Sonu Hooda;Evgeny Zamburg;Aaron Voon-Yew Thean-Integrative Sciences and Engineering Programme,NUS Graduate School,National University of Singapore,Singapore,Singapore;Department of Electrical and Computer Engineering,National University of Singapore,4 Engineering Drive 3,Singapore 117583,Singapore

Di Zhu;Changchen Chen;Mengjie Yu;Linbo Shao;Yaowen Hu;C J.Xin;Matthew Yeh;Soumya Ghosh;Lingyan He;Christian Reimer;Neil Sinclair;Franco N.C.Wong;Mian Zhang;Marko Lon?ar-John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA 02138,USA;Institute of Materials Research and Engineering,Agency for Science,Technology and Research(A*STAR),Singapore 138634,Singapore;Research Laboratory of Electronics,Massachusetts Institute of Technology,Cambridge,MA 02139,USA;HyperLight Corporation,1 Bow Street,Suite 420,Cambridge,MA 02139,USA;Division of Physics,Mathematics and Astronomy,and Alliance for Quantum Technologies(AQT),California Institute of Technology,Pasadena,CA 91125,USA

WANG Bo;DUAN Shaoxiang;ZHANG Hao;XU Haijin;LIU Bo;QIAO Mingqiang-The Key Laboratory of Molecular Microbiology and Technology,Ministry of Education,Nankai University,Tianjin 300071,China;Institute of Modern Optics,Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology,Nankai University,Tianjin 300350,China;School of Life Science,Shanxi University,Taiyuan 030006,China

YANG Fan;CAO Ye;LI Meiqi;JU Hui;LI Lijun-School of Electronic and Information,Qingdao University,Qingdao 266071,China;College of Electronic Information Engineering,Shandong University of Science and Technology,Qingdao 266590,China

HAYK GEVORGYAN;ANATOL KHILO;MARK T.WADE;VLADIMIR M.STOJANOVI?;MILO? A.POPOVI?-Department of Electrical and Computer Engineering,Boston University,Boston,Massachusetts 02215,USA;Ayar Labs Inc.,Emeryville,California 94608,USA;Department of Electrical Engineering and Computer Sciences,University of California Berkeley,Berkeley,California 94709,USA

XIAODONG SHI;JINGJING ZHANG;WEICHEN FAN;YAOQIN LU;NIANHUA PENG;KARSTEN ROTTWITT;HAIYAN OU-DTU Fotonik,Technical University of Denmark,DK-2800 Lyngby,Denmark;Institute of Mirco/Nano Optoelectronic and Terahertz Technology,Jiangsu University,Zhenjiang 212013,China;Surrey Ion Beam Centre,Surrey University,Guildford,GU2 7XH,UK

GENGXIN CHEN;ZILIANG RUAN;ZONG WANG;PUCHENG HUANG;CHANGJIAN GUO;DAOXIN DAI;KAIXUAN CHEN;LIU LIU-State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Hangzhou 310058,China;Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center,Guangzhou 510006,China;National Center for International Research on Green Optoelectronics,South China Normal University,Guangzhou 510006,China

Stanley Cheung;Geza Kurczveil;Yingtao Hu;Mingye Fu;Yuan Yuan;Di Liang;Raymond G. Beausoleil-Hewlett Packard Labs, Hewlett Packard Enterprise, Milpitas, California 95035, USA

STANLEY CHEUNG;GEZA KURCZVEIL;YINGTAO HU;MINGYE FU;YUAN YUAN;DI LIANG;RAYMOND G.BEAUSOLEIL-Hewlett Packard Labs,Hewlett Packard Enterprise,Milpitas,California 95035,USA

WEIHONG SHEN;GANGQIANG ZHOU;JIANGBING DU;LINJIE ZHOU;KE XU;ZUYUAN HE-Peng Cheng Laboratory,Shenzhen 518055,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,Shanghai Jiao Tong University,Shanghai 200240,China;Department of Electronic and Information Engineering,Harbin Institute of Technology(Shenzhen),Shenzhen 518055,China

BINGCHENG PAN;HONGYUAN CAO;YISHU HUANG;ZONG WANG;KAIXUAN CHEN;HUAN LI;ZEJIE YU;DAOXIN DAI-State Key Laboratory for Modem Optical Instrumentation,Center for Optical&Electromagnetic Research,College of Optical Science and;Engineering,International Research Center for Advanced Photonics,Zhejiang University,Zijingang Campus,Hangzhou 310058,China;Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center Guangzhou 510006,China;Jiaxing Key Laboratory of Photonic Sensing&Intelligent Imaging,Jiaxing 314000,China;Intelligent Optics&Photonics Research Center,Jiaxing Research Institute Zhejiang University,Jiaxing 314000,China

BIQIANG JIANG;XIAOMING ZHANG;AILUN LI;YUEGUO HOU;ZHEN HAO;XUETAO GAN;JIANLIN ZHAO-Key Laboratory of Light Field Manipulation and Information Acquisition,Ministry of Industry and Information Technology,and Shaanxi Key Laboratory of Optical Information Technology,School of Physical Science and Technology,Northwestern Polytechnical University,Xi'an 710129,China

XIANGWEN GUO;LINBO SHAO;LINGYAN HE;KEVIN LUKE;JESSE MORGAN;KEYE SUN;JUNYI GAO;TA-CHING TZU;YANG SHEN;DEKANG CHEN;BINGTIAN GUO;FENGXIN YU;QIANHUAN YU;MASOUD JAFARI;MARKO LON?AR;MIAN ZHANG;ANDREAS BELING-Department of Electrical and Computer Engineering,University of Virginia,Charlottesville,Virginia 22903,USA;John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,Massachusetts 02138,USA;HyperLight Corporation,Cambridge,Massachusetts 02139,USA

HAO CHEN;ZEXING ZHAO;ZIMING ZHANG;GUOQING WANG;JIATONG LI;ZHENYUAN SHANG;MENGYU ZHANG;KAI GUO;JUNBO YANG;PEIGUANG YAN-College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China;Institute of Systems Engineering,AMS,Beijing 100039,China;College of Liberal Arts and Sciences,National University of Defense Technology,Changsha 410073,China

HANKE FENG;KE ZHANG;WENZHAO SUN;YANGMING REN;YIWEN ZHANG;WENFU ZHANG;CHENG WANG-Department of Electrical Engineering&State Key Laboratory of Terahertz and Millimeter Waves,City University of Hong Kong,Kowloon,Hong Kong,China;State Key Laboratory of Transient Optics and Photonics,Xi'an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi'an 710119,China;University of Chinese Academy of Sciences,Beijing 100049,China

YIWEN ZHANG;LINBO SHAO;JINGWEI YANG;ZHAOXI CHEN;KE ZHANG;KAM-MAN SHUM;DI ZHU;CHI HOU CHAN;MARKO LON?AR;CHENG WANG-Department of Electrical Engineering,City University of Hong Kong,Kowloon,Hong Kong,China;John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,Massachusetts 02138,USA;Bradley Department of Electrical and Computer Engineering,Virginia Tech,Blacksburg,Virginia 24061,USA;State Key Laboratory of Terahertz and Millimeter Waves,City University of Hong Kong,Kowloon,Hong Kong,China;Institute of Materials Research and Engineering,Agency for Science,Technology and Research(A*STAR),Singapore 138634,Singapore

WEI KE;YANMEI LIN;MINGBO HE;MENGYUE XU;JIAXIANG ZHANG;ZHONGJIN LIN;SIYUAN YU;XINLUN CAI-State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-sen University,Guangzhou 510275,China;State Key Laboratory of Functional Materials for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200092,China;Department of Electrical and Computer Engineering,The University of British Columbia,Vancouver,British Columbia V6T 1Z4,Canada