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典型文献
White light interferometry with spectral-temporal demodulation for large-range thickness measurement
文献摘要:
Film thickness measurement can be realized using white light interferometry, but it is challenging to guarantee high precision in a large range of thicknesses. Based on scanning white light interferometry, we propose a spectral-temporal demodulation scheme for large-range thickness measurement. The demodulation process remains unchanged for either coatings or substrate-free films, while some adjustments are made according to the estimated optical thickness. Experiments show that the single-point repeatabilities for 500 nm SiO2 coating and 68 μm substrate-free Si film are no more than 0.70 nm and 1.22 nm, respectively. This method can be further developed for simultaneous measurement of surface profile and film thickness.
文献关键词:
作者姓名:
Yunlong Zhu;Zhuoran Li;Xu Lu;Yonggui Yuan;Jun Yang
作者机构:
Key Laboratory of In-fiber Integrated Optics, Ministry of Education of China, Harbin Engineering University, Harbin 150001, China;College of Physics and Optoelectronic Engineering, Harbin Engineering University, Harbin 150001, China;Guangdong Provincial Key Laboratory of Information Photonics Technology (Guangdong University of Technology), Guangzhou 510006, China;School of Information Engineering, Guangdong University of Technology, Guangzhou 510008, China
引用格式:
[1]Yunlong Zhu;Zhuoran Li;Xu Lu;Yonggui Yuan;Jun Yang-.White light interferometry with spectral-temporal demodulation for large-range thickness measurement)[J].中国光学快报(英文版),2022(09):091201
A类:
repeatabilities
B类:
White,light,interferometry,spectral,temporal,demodulation,large,range,measurement,Film,be,realized,using,white,but,challenging,guarantee,high,precision,thicknesses,Based,scanning,we,propose,scheme,process,remains,unchanged,either,coatings,substrate,free,films,while,some,adjustments,are,made,according,estimated,optical,Experiments,show,that,single,point,SiO2,no,more,than,respectively,This,method,further,developed,simultaneous,surface,profile
AB值:
0.554442
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