Shiying Cao;Yi Han;Yongjin Ding;Baike Lin;Zhanjun Fang-Division of Time and Frequency Metrology,National Institute of Metrology,Beijing 100029,China

Shuyuan Lv;Xinhui Li;Wenfeng Luo;Jie Jia-Xi'an University of Posts&Telecommunications,School of Electronic Engineering,Xi'an 710121,China

Yudong Lu;Yi Xu;Xu Ouyang;Mingcong Xian;Yaoyu Cao;Kai Chen;Xiangping Li-Guangdong Provincial Key Laboratory of Optical Fiber Sensing and Communications,Institute of Photonics Technology,Jinan University,Guangzhou 510632,China;Department of Electronic Engineering,College of Information Science and Technology,Jinan University,Guangzhou 510632,China

Arnaldo Leal-Junior;Leticia Avellar;Vitorino Biazi;M.Simone Soares;Anselmo Frizera;Carlos Marques-Graduate Program in Electrical Engineering,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;Mechanical Engineering Department,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;I3N&Physics Department,University of Aveiro,Aveiro 3810-193,Portugal

Huixin Qi;Zhuochen Du;Xiaoyong Hu;Jiayu Yang;Saisai Chu;Qihuang Gong-State Key Laboratory for Mesoscopic Physics&Department of Physics,Collaborative Innovation Center of Quantum Matter&Frontiers Science Center for Nano-optoelectronics,Beijing Academy of Quantum Information Sciences,Peking University,Beijing 100871,China;Peking University Yangtze Delta Institute of Optoelectronics,Nantong 226010,China;Collaborative Innovation Center of Extreme Optics,Shanxi University,Taiyuan 030006,China

Shunliang Gao;Xiaohui Zhao;Qi Fu;Tianchi Zhang;Jun Zhu;Fuhua Hou;Jian Ni;Chengjun Zhu;Tiantian Li;Yanlai Wang;Vignesh Murugadoss;Gaber A.M.Mersal;Mohamed M.Ibrahim;Zeinhom M.El-Bahy;Mina Huang;Zhanhu Guo-The Key Laboratory of Semiconductor Photovoltaic Technology at Universities of Inner Mongolia Autonomous Region,College of Physical Science and Technology,Inner Mongolia University,Hohhot 010021,China;Department of Electronic Science and Technology,School of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China;Advanced Materials Division,Engineered Multifunctional Composites(EMC)Nanotech LLC,Knoxville,TN 37934,United States;Integrated Composites Laboratory(ICL),Department of Chemical and Bimolecular Engineering,University of Tennessee,Knoxville,TN 37996,United States;Department of Chemistry,College of Science,Taif University,P.O.Box 11099,Taif 21944,Saudi Arabia;Department of Chemistry,Faculty of Science,Al-Azhar University,Nasr City 11884,Cairo,Egypt;College of Materials Science and Engineering,Taiyuan University of Science and Technology,Taiyuan 030024,China

Yan Zhang;Shihai Miao;Yanjie Liang;Chao Liang;Dongxun Chen;Xihui Shan;Kangning Sun;Xiao-Jun Wang-Key Laboratory for Liquid-Solid Structure Evolution and Processing of Materials,Ministry of Education,Shandong University,Jinan 250061,China;Jiangsu Bree Optronics Co.,Ltd,Nanjing 211103,China;Department of Physics,Georgia Southern University,Statesboro,GA 30460,USA

Fan Zhang;Jose F.Castaneda;Timothy H.Gfroerer;Daniel Friedman;Yong-Hang Zhang;Mark W.Wanlass;Yong Zhang-Department of Electrical and Computer Engineering,The University of North Carolina at Charlotte,Charlotte,NC 28223,USA;Songshan Lake Materials Laboratory,Dongguan,Guangdong 523808,China;Department of Physics,Davidson College,Davidson,NC 28035,USA;National Renewable Energy Laboratory,Golden,CO 80401,USA;School of Electrical,Computer and Energy Engineering,Arizona State University,Tempe,AZ 85287,USA;Wanlass Consulting,Norwood,CO 81423,USA

Shampy Mansha;Parikshit Moitra;Xuewu Xu;Tobias W.W.Mass;Rasna Maruthiyodan Veetil;Xinan Liang;Shi-Qiang Li;Ramón Paniagua-Domínguez;Arseniy I.Kuznetsov-Institute of Materials Research and Engineering,A*STAR(Agency for Science,Technology and Research),138634 Singapore,Singapore

Zhaoqing Li;Olivier Allegre;Lin Li-Department of Mechanical,Aerospace and Civil Engineering,The University of Manchester,Manchester M13 9PL,UK

ZHAO Zanshan;XING Weiguang;GAN Weiming-Haikou Lab,Institute of Acoustics,Chinese Academy of Sciences,Haikou 570100,China

DI Ke;WANG Wenbo;CUI Wei;GUO Junqi;LIU Yu;DU Jiajia-Chongqing Engineering Research Center of Intelligent Sensing Technology and Microsystem,Chongqing University of Post and Telecommunications,Chongqing 400065,China

HAYK GEVORGYAN;ANATOL KHILO;MARK T.WADE;VLADIMIR M.STOJANOVI?;MILO? A.POPOVI?-Department of Electrical and Computer Engineering,Boston University,Boston,Massachusetts 02215,USA;Ayar Labs Inc.,Emeryville,California 94608,USA;Department of Electrical Engineering and Computer Sciences,University of California Berkeley,Berkeley,California 94709,USA

YONGHUA WANG;Su HE;XIAOYAN GAO;PIAOPIAO YE;LEI LEI;WENCHAN DONG;XINLIANG ZHANG;PING XU-College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China;School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China

YISI DONG;PENG-CHENG HU;HAIJIN FU;HONGXING YANG;RUITAO YANG;JIUBIN TAN-Center of Ultra-precision Optoelectronic Instrument,Harbin Institute of Technology,Harbin 150080,China;Key Laboratory of Ultra-precision Intelligent Instrumentation(Harbin Institute of Technology),Ministry of Industry and Information Technology,Harbin 150080,China

TONGTONG KANG;BOYU FAN;JUN QIN;WEIHAO YANG;SHUANG XIA;ZHENG PENG;BO LIU;SUI PENG;XIAO LIANG;TINGTING TANG;LONGJIANG DENG;YI LUO;HANBIN WANG;QIANG ZHOU;LEI BI-National Engineering Research Center of Electromagnetic Radiation Control Materials,University of Electronic Science and Technology of China,Chengdu 610054,China;State Key Laboratory of Electronic Thin-Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China;Institute of Fundamental and Frontier Sciences,University of Electronic Science and Technology of China,Chengdu 610054,China;College of Optoelectronic Engineering,Chengdu University of Information Technology,Chengdu 610225,China;State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization,Panzhihua 617000,China;Microsystem&Terahertz Research Center,China Academy of Engineering Physics(CAEP),Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics(CAEP),Mianyang 621900,China

XIAOHAN WANG;KUNPENG JIA;MENGWEN CHEN;SHANSHAN CHENG;XIN NI;JIAN GUO;YIHAO LI;HUAYING LIU;LIYUN HAO;JIAN NING;GANG ZHAO;XINJIE LV;SHU-WEI HUANG;ZHENDA XIE;SHI-NING ZHU-National Laboratory of Solid State Microstructures,School of Electronic Science and Engineering,School of Physics,College of Engineering and Applied Sciences,and Collaborative Innovation Center of Advanced Microstructures,Nanjing University,Nanjing 210093,China;Department of Electrical,Computer and Energy Engineering,University of Colorado Boulder,Boulder,Colorado 80309,USA

KRISHNA MURARI;GIOVANNI CIRMI;HüSEYIN CANKAYA;GREGORY J.STEIN;BENOIT DEBORD;FREDERIC GéR?ME;FELIX RITZKOSKY;FETAH BENABID;OLIVER MUECKE;FRANZ X.K?RTNER-Center for Free Electron Laser Science CFEL,Deutsches Elektronen-Synchrotron DESY,22607 Hamburg,Germany;Max-Planck Institute for Structure and Dynamics of Matter(MPSD),22761 Hamburg,Germany;ELI-ALPS,ELI-HU Non-Profit Ltd.,Szeged H-6728,Hungary;The Hamburg Center for Ultrafast Imaging&Department of Physics,University of Hamburg,22761 Hamburg,Germany;GPPMM Group,XLIM Research Institute,UMR 7252 CNRS,University of Limoges,Limoges,France

JING-ZHI HUANG;ZI-TAO JI;JIA-JIAN CHEN;WEN-QI WEI;JIA-LE QIN;ZI-HAO WANG;ZHI-YUAN LI;TING WANG;XI XIAO;JIAN-JUN ZHANG-Beijing National Laboratory for Condensed Matter Physics,Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China;Center of Materials Science and Optoelectronic Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;School of Physics and Optoelectronics,South China University of Technology,Guangzhou 510641,China;Songshan Lake Materials Laboratory,Dongguan 523808,China;National Information Optoelectronics Innovation Center,China Information and Communication Technologies Group Corporation(CICT),Wuhan 430074,China

GUOWU ZHANG;DAN-XIA XU;YURI GRINBERG;ODILE LIBOIRON-LADOUCEUR-Department of Electrical and Computer Engineering,McGill University,Montréal,Quebec H3A OE9,Canada;National Research Council Canada,Ottawa,Ontario K1A OR6,Canada