Xuyang Wang;He Jia;Junhui Li;Yumei Guo;Yu Liu-State Key Laboratory on Integrated Optoelectronics,Institution of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;University of Chinese Academy of Sciences,Beijing 100049,China;Beijing Shiweitong Science&Technology Co.,Ltd.,Beijing 100176,China

Kaixuan Chen;Gengxin Chen;Ziliang Ruan;Xuancong Fan;Junwei Zhang;Ranfeng Gan;Jie Liu;Daoxin Dai;Changjian Guo;Liu Liu-Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center,Guangzhou 510006,China;National Center for International Research on Green Optoelectronics,South China Normal University,Guangzhou 510006,China;State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Hangzhou 310058,China;State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-Sen University,Guangzhou 510006,China;Jiaxing Key Laboratory of Photonic Sensing & Intelligent Imaging,Intelligent Optics & Photonics Research Center,Jiaxing Research Institute,Zhejiang University,Jiaxing 314000,China

Bingxin Xu;Xinyu Fan;Shuai Wang;Zuyuan He-State Key Laboratory of Advanced Optical Communication Systems and Networks,Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China.

Zhongjin Lin;Yanmei Lin;Hao Li;Mengyue Xu;Mingbo He;Wei Ke;Heyun Tan;Ya Han;Zhaohui Li;Dawei Wang;X.Steve Yao;Songnian Fu;Siyuan Yu;Xinlun Cai-State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-sen University,510275 Guangzhou,China;Department of Electrical and Computer Engineering,The University of British Columbia,Vancouver,BC V6T 1Z4,Canada;Photonics Information Innovation Center and Hebei Provincial Center for Optical Sensing Innovations,College of Physics Science and Technology,Hebei University,071002 Baoding,China;Institute of Advanced Photonics Technology,School of Information Engineering,Guangdong University of Technology,510006 Guangzhou,China

Ruijuan Tian;Xuetao Gan;Chen Li;Xiaoqing Chen;Siqi Hu;Linpeng Gu;Dries Van Thourhout;Andres Castellanos-Gomez;Zhipei Sun;Jianlin Zhao-Key Laboratory of Light Field Manipulation and Information Acquisition,Ministry of Industry and Information Technology,and Shaanxi Key Laboratory of Optical Information Technology,School of Physical Science and Technology,Northwestern Polytechnical University,710129 Xi'an,China;Photonics Research Group and Center for Nano and Biophotonics,Ghent University,B-9000 Gent,Belgium;Materials Science Factory,Instituto de Ciencia de Materiales de Madrid(ICMM-CSIC),E-28049 Madrid,Spain;Department of Electronics and Nanoengineering and QTF Centre of Excellence,Aalto University,Fl-02150 Espoo,Finland

Lei Wan;Zhiqiang Yang;Wenfeng Zhou;Meixun Wen;Tianhua Feng;Siqing Zeng;Dong Liu;Huan Li;Jingshun Pan;Ning Zhu;Weiping Liu;Zhaohui Li-Department of Electronic Engineering,College of Information Science and Technology,Jinan University,510632 Guangzhou,China;Guangdong Provincial Key Laboratory of Optoelectronic Information Processing Chips and Systems,Sun Yat-sen University,510275 Guangzhou,China;State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Zijingang Campus,310058 Hangzhou,China;Institute of Semiconductor Science and Technology,Guangdong Engineering Technology Research Center of Low Carbon and New Energy Materials,South China Normal University,510631 Guangzhou,China;Southern Marine Science and Engineering Guangdong Laboratory(Zhuhai),519000 Zhuhai,China

Di Zhu;Changchen Chen;Mengjie Yu;Linbo Shao;Yaowen Hu;C J.Xin;Matthew Yeh;Soumya Ghosh;Lingyan He;Christian Reimer;Neil Sinclair;Franco N.C.Wong;Mian Zhang;Marko Lon?ar-John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA 02138,USA;Institute of Materials Research and Engineering,Agency for Science,Technology and Research(A*STAR),Singapore 138634,Singapore;Research Laboratory of Electronics,Massachusetts Institute of Technology,Cambridge,MA 02139,USA;HyperLight Corporation,1 Bow Street,Suite 420,Cambridge,MA 02139,USA;Division of Physics,Mathematics and Astronomy,and Alliance for Quantum Technologies(AQT),California Institute of Technology,Pasadena,CA 91125,USA

GENGXIN CHEN;ZILIANG RUAN;ZONG WANG;PUCHENG HUANG;CHANGJIAN GUO;DAOXIN DAI;KAIXUAN CHEN;LIU LIU-State Key Laboratory for Modern Optical Instrumentation,College of Optical Science and Engineering,International Research Center for Advanced Photonics,Zhejiang University,Hangzhou 310058,China;Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center,Guangzhou 510006,China;National Center for International Research on Green Optoelectronics,South China Normal University,Guangzhou 510006,China

YONGHUA WANG;Su HE;XIAOYAN GAO;PIAOPIAO YE;LEI LEI;WENCHAN DONG;XINLIANG ZHANG;PING XU-College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China;School of Optical and Electronic Information,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,Huazhong University of Science and Technology,Wuhan 430074,China

JIACHENG LIU;GANGQIANG ZHOU;JIANGBING Du;WEIHONG SHEN;LINJIE ZHOU;ZUYUAN HE-State Key Laboratory of Advanced Optical Communication Systems and Networks,Shanghai Jiao Tong University,Shanghai 200240,China;Peng Cheng Laboratory,Shenzhen 518055,China

WEIHONG SHEN;GANGQIANG ZHOU;JIANGBING DU;LINJIE ZHOU;KE XU;ZUYUAN HE-Peng Cheng Laboratory,Shenzhen 518055,China;State Key Laboratory of Advanced Optical Communication Systems and Networks,Shanghai Jiao Tong University,Shanghai 200240,China;Department of Electronic and Information Engineering,Harbin Institute of Technology(Shenzhen),Shenzhen 518055,China

BINGCHENG PAN;HONGYUAN CAO;YISHU HUANG;ZONG WANG;KAIXUAN CHEN;HUAN LI;ZEJIE YU;DAOXIN DAI-State Key Laboratory for Modem Optical Instrumentation,Center for Optical&Electromagnetic Research,College of Optical Science and;Engineering,International Research Center for Advanced Photonics,Zhejiang University,Zijingang Campus,Hangzhou 310058,China;Guangdong Provincial Key Laboratory of Optical Information Materials and Technology,South China Academy of Advanced Optoelectronics,South China Normal University,Higher-Education Mega-Center Guangzhou 510006,China;Jiaxing Key Laboratory of Photonic Sensing&Intelligent Imaging,Jiaxing 314000,China;Intelligent Optics&Photonics Research Center,Jiaxing Research Institute Zhejiang University,Jiaxing 314000,China

YUGUANG ZHANG;HONGGUANG ZHANG;JUNWEN ZHANG;JIA LIU;LEI WANG;DAIGAO CHEN;NAN CHI;XI XIAO;SHAOHUA YU-State Key Laboratory of Optical Communication Technologies and Networks,China Information and Communication Technologies Group Corporation(CICT),Wuhan 430074,China;National Information Optoelectronics Innovation Center,Wuhan 430074,China;Key Laboratory of Information Science of Electromagnetic Waves(MoE),Fudan University,Shanghai 200433,China;Peng Cheng Laboratory,Shenzhen 518055,China

XIANGWEN GUO;LINBO SHAO;LINGYAN HE;KEVIN LUKE;JESSE MORGAN;KEYE SUN;JUNYI GAO;TA-CHING TZU;YANG SHEN;DEKANG CHEN;BINGTIAN GUO;FENGXIN YU;QIANHUAN YU;MASOUD JAFARI;MARKO LON?AR;MIAN ZHANG;ANDREAS BELING-Department of Electrical and Computer Engineering,University of Virginia,Charlottesville,Virginia 22903,USA;John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,Massachusetts 02138,USA;HyperLight Corporation,Cambridge,Massachusetts 02139,USA

HAO CHEN;ZEXING ZHAO;ZIMING ZHANG;GUOQING WANG;JIATONG LI;ZHENYUAN SHANG;MENGYU ZHANG;KAI GUO;JUNBO YANG;PEIGUANG YAN-College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China;Institute of Systems Engineering,AMS,Beijing 100039,China;College of Liberal Arts and Sciences,National University of Defense Technology,Changsha 410073,China

YOUNGHYUN KIM;DIDIT YUDISTIRA;BERNARDETTE KUNERT;MARINA BARYSHNIKOVA;REYNALD ALCOTTE;CENK IBRAHIM OZDEMIR;SANGHYEON KIM;SEBASTIEN LARDENOIS;PETER VERHEYEN;JORIS VAN CAMPENHOUT;MARIANNA PANTOUVAKI-IMEC,Heverlee B-3001,Belgium;Department of Photonics and Nanoelectronics,BK21 FOUR ERICA-ACE Center,Hanyang University,Ansan 15588,Republic of Korea;School of Electrical Engineering,Korea Advanced Institute of Science and Technology(KAIST),Daejeon 34141,Republic of Korea

Daigao Chen;Hongguang Zhang;Min Liu;Xiao Hu;Yuguang Zhang;Dingyi Wu;Peiqi Zhou;Siyao Chang;Lei Wang;Xi Xiao-National Information Optoelectronics Innovation Center, China Information and Communication Technologies Group Corporation (CICT), Wuhan 430074, China;State Key Laboratory of Optical Communication Technologies and Networks, China Information and Communication Technologies Group Corporation (CICT), Wuhan 430074, China;Peng Cheng Laboratory, Shenzhen 518055, China

HANKE FENG;KE ZHANG;WENZHAO SUN;YANGMING REN;YIWEN ZHANG;WENFU ZHANG;CHENG WANG-Department of Electrical Engineering&State Key Laboratory of Terahertz and Millimeter Waves,City University of Hong Kong,Kowloon,Hong Kong,China;State Key Laboratory of Transient Optics and Photonics,Xi'an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi'an 710119,China;University of Chinese Academy of Sciences,Beijing 100049,China

YIWEN ZHANG;LINBO SHAO;JINGWEI YANG;ZHAOXI CHEN;KE ZHANG;KAM-MAN SHUM;DI ZHU;CHI HOU CHAN;MARKO LON?AR;CHENG WANG-Department of Electrical Engineering,City University of Hong Kong,Kowloon,Hong Kong,China;John A.Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,Massachusetts 02138,USA;Bradley Department of Electrical and Computer Engineering,Virginia Tech,Blacksburg,Virginia 24061,USA;State Key Laboratory of Terahertz and Millimeter Waves,City University of Hong Kong,Kowloon,Hong Kong,China;Institute of Materials Research and Engineering,Agency for Science,Technology and Research(A*STAR),Singapore 138634,Singapore

WEI KE;YANMEI LIN;MINGBO HE;MENGYUE XU;JIAXIANG ZHANG;ZHONGJIN LIN;SIYUAN YU;XINLUN CAI-State Key Laboratory of Optoelectronic Materials and Technologies,School of Electronics and Information Technology,Sun Yat-sen University,Guangzhou 510275,China;State Key Laboratory of Functional Materials for Informatics,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200092,China;Department of Electrical and Computer Engineering,The University of British Columbia,Vancouver,British Columbia V6T 1Z4,Canada