典型文献
In-situ/operando characterization techniques for organic semiconductors and devices
文献摘要：
The increasing demands of multifunctional organic electronics require advanced organic semiconducting materials to be developed and significant improvements to be made to device performance.Thus,it is necessary to gain an in-depth un-derstanding of the film growth process,electronic states,and dynamic structure-property relationship under realistic opera-tion conditions,which can be obtained by in-situ/operando characterization techniques for organic devices.Here,the up-to-date developments in the in-situ/operando optical,scanning probe microscopy,and spectroscopy techniques that are em-ployed for studies of film morphological evolution,crystal structures,semiconductor-electrolyte interface properties,and charge carrier dynamics are described and summarized.These advanced technologies leverage the traditional static characteriza-tions into an in-situ and interactive manipulation of organic semiconducting films and devices without sacrificing the resolu-tion,which facilitates the exploration of the intrinsic structure-property relationship of organic materials and the optimization of organic devices for advanced applications.
文献关键词：
中图分类号：
作者姓名：
Sai Jiang;Qinyong Dai;Jianhang Guo;Yun Li
作者机构：
School of Microelectronics and Control Engineering,Changzhou University,Changzhou 213164,China;National Laboratory of Solid-State Microstructures,School of Electronic Science and Engineering,Collaborative Innovation Center of Advanced Microstructures,Nanjing University,Nanjing 210093,China
文献出处：
引用格式：
[1]Sai Jiang;Qinyong Dai;Jianhang Guo;Yun Li-.In-situ/operando characterization techniques for organic semiconductors and devices)[J].半导体学报（英文版）,2022(04):15-25
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B类：
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AB值：
0.552696
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