Bao-Qin Lin;Wen-Zhun Huang;Lin-Tao Lv;Jian-Xin Guo;Yan-Wen Wang;Hong-Jun Ye-School of Information Engineering,Xijing University,Xi'an 710123,China

Guangzhou Geng;Ruhao Pan;Wei Zhu;Junjie Li-Beijing National Laboratory for Condensed Matter Physics,Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China;School of Electronic and Electrical Engineering,Wuhan Textile University,Wuhan 430200,China

Di Zhang;Yang Chen;Shengchao Gong;Wei Wu;Wei Cai;Mengxin Ren;Xifeng Ren;Shuang Zhang;Guangcan Guo;Jingjun Xu-The Key Laboratory of Weak-Light Nonlinear Photonics,Ministry of Education,School of Physics and TEDA Applied Physics Institute,Nankai University,Tianjin,China;Key Laboratory of Quantum Information,CAS,University of Science and Technology of China,Hefei,China;Synergetic Innovation Center of Quantum Information&Quantum Physics,University of Science and Technology of China,Hefei,China;Collaborative Innovation Center of Extreme Optics,Shanxi University,Taiyuan,China;Department of Physics,The University of Hong Kong,Hong Kong,China

Jun Chen Ke;Jun Yan Dai;Jun Wei Zhang;Zhanye Chen;Ming Zheng Chen;Yunfeng Lu;Lei Zhang;Li Wang;Qun Yan Zhou;Long Li;Jin Shan Ding;Qiang Cheng;Tie Jun Cui-Institute of Electromagnetic Space,Southeast University,210096 Nanjing,China;State Key Laboratory of Millimeter Waves,Southeast University,210096 Nanjing,China;School of Electronic Engineering,Xidian University,710071 Xi'an,China

Zhiming ZHAO;Xiaoping LI;Guoxiang DONG;Yanming LIU-School of Aerospace Science and Technology,Xidian University,Xi'an 710126,People's Republic of China

Aviv Karnieli;Yongyao Li;Ady Arie-Raymond and Beverly Sackler School of Physics and Astronomy,Tel Aviv University,Ramat Aviv 69978,Tel Aviv,Israel;School of Physics and Optoelectronic Engineering,Foshan University,Foshan 528000,China;School of Electrical Engineering,Fleischman Faculty of Engineering,Tel Aviv University,Tel Aviv,Israel

Bo Fang;Dantian Feng;Peng Chen;Lijiang Shi;Jinhui Cai;Jianmin Li;Chenxia Li;Zhi Hong;Xufeng Jing-College of Metrology&Measurement Engineering,China Jiliang University,Hangzhou 310018,China;Institute of Optoelectronic Technology,China Jiliang University,Hangzhou 310018,China;Centre for THz Research,China Jiliang University,Hangzhou 310018,China;Hangzhou Hangxin Qihui Technology Co.,Ltd,Hangzhou 310026,China;University of Shanghai for Science and Technology,No.516 Jung Gong Road,Shanghai 200093,China

Jun ChenKe;Xiangyu Chen;Wankai Tang;Ming Zheng Chen;Lei Zhang;Li Wang;Jun Yan Dai;Jin Yang;Jun Wei Zhang;Lijie Wu;Qiang Cheng;Shi Jin;Tie Jun Cui-State Key Laboratory of Millimeter Waves,Southeast University,Nanjing 210096,China;Institute of Electromagnetic Space,Southeast University Nanjing 210096 China;Frontiers Science Center for Mobile Information Communication and Security,Southeast University,Nanjing 210096,China;National Mobile Communications Research Laboratory,Southeast University,Nanjing 210096 China;Southeast University Wuxi Campus,Wuxi 214061,China

TONGTONG KANG;BOYU FAN;JUN QIN;WEIHAO YANG;SHUANG XIA;ZHENG PENG;BO LIU;SUI PENG;XIAO LIANG;TINGTING TANG;LONGJIANG DENG;YI LUO;HANBIN WANG;QIANG ZHOU;LEI BI-National Engineering Research Center of Electromagnetic Radiation Control Materials,University of Electronic Science and Technology of China,Chengdu 610054,China;State Key Laboratory of Electronic Thin-Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China;Institute of Fundamental and Frontier Sciences,University of Electronic Science and Technology of China,Chengdu 610054,China;College of Optoelectronic Engineering,Chengdu University of Information Technology,Chengdu 610225,China;State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization,Panzhihua 617000,China;Microsystem&Terahertz Research Center,China Academy of Engineering Physics(CAEP),Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics(CAEP),Mianyang 621900,China

YIBO PAN;FENG LAN;YAXIN ZHANG;HONGXIN ZENG;LUYANG WANG;TIANYANG SONG;GUIJU HE;ZIQIANG YANG-School of Electronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China;Yangtze Delta Region Institute(Huzhou),University of Electronic Science and Technology of China,Huzhou 313001,China

HONGQIANG ZHOU;XIN LI;ZHENTAO XU;XIAOWEI LI;GUANGZHOU GENG;JUNJIE LI;YONGTIAN WANG;LINGLING HUANG-Beijing Engineering Research Center of Mixed Reality and Advanced Display,School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China;Beijing Aerospace Automatic Control Institute,Beijing 100143,China;Laser Micro/Nano-Fabrication Laboratory,School of Mechanical Engineering,Beijing Institute of Technology,Beijing 100081,China;Institute of Physics,Chinese Academy of Sciences,Beijing 100191,China

ATA UR RAHMAN KHALID;Fu FENG;NAEEM ULLAH;XIAOCONG YUAN;MICHAEL GEOFFREY SOMEKH-Nanophotonics Research Center,Shenzhen Key Laboratory of Micro-Scale Optical Information Technology&Institute of Microscale Optoelectronics,Shenzhen University,Shenzhen 518060,China;Beijing Engineering Research Center for Mixed Reality and Advanced Display,School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China;Faculty of Engineering,University of Nottingham,Nottingham NG7 2RD,UK

SHIFEI ZHANG;LINGLING HUANG;GUANGZHOU GENG;JUNJIE LI;XIAOWEI LI;YONGTIAN WANG-Beijing Engineering Research Center of Mixed Reality and Advanced Display,School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China;Institute of Physics,Chinese Academy of Sciences,Beijing 100191,China;Laser Micro/Nano-Fabrication Laboratory,School of Mechanical Engineering,Beijing Institute of Technology,Beijing 100081,China

GUOQING JING;PEIPEI WANG;HAISHENG WU;JIANJUN REN;ZHIQIANG XIE;JUNMIN LIU;HUAPENG YE;YING LI;DIANYUAN FAN;SHUQING CHEN-International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology,Institute of Microscale Optoelectronics,Shenzhen University,Shenzhen 518060,China;College of New Materials and New Energies,Shenzhen Technology University,Shenzhen 518118,China;Guangdong Provincial Key Laboratory of Optical Information Materials and Technology and Institute of Electronic Paper Displays,South China Academy of Advanced Optoelectronics,South China Normal University,Guangzhou 510006,China

YANG ZHU;BINBIN LU;ZHIYUAN FAN;FUYONG YUE;XIAOFEI ZANG;ALEXEI V.BALAKIN;ALEXANDER P.SHKURINOV;YIMING ZHU;SONGLIN ZHUANG-Terahertz Technology Innovation Research Institute,Terahertz Spectrum and Imaging Technology Cooperative Innovation Center,Shanghai Key Laboratory of Modern Optical System,University of Shanghai for Science and Technology,Shanghai 200093,China;Shanghai Institute of Intelligent Science and Technology,Tongji University,Shanghai 200092,China;Department of Physics,Lomonosov Moscow State University,Moscow 119991,Russia

SHOUJUN ZHANG;XIEYU CHEN;KUAN LIU;HAIYANG LI;YUEHONG XU;XIAOHAN JIANG;YIHAN XU;QINGWEI WANG;TUN CAO;ZHEN TIAN-Center for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering,Key Laboratory of Optoelectronic Information Technology(Ministry of Education of China),Tianjin University,Tianjin 300072,China;School of Optoelectronic Engineering and Instrumentation Science,Dalian University of Technology,Dalian 116024,China;Georgia Tech Shenzhen Institute(GTSI),Tianjin University,Shenzhen 518067,China

Yu Li;Xinhao Fan;Xuyue Guo;Yi Zhang;Sheng Liu;Bingyan Wei;Dandan Wen;Peng Li;Jianlin Zhao-MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions, and Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi’an 710129, China;Xi’an Ming De Institute of Technology, Xi’an 710124, China;Department of Electronics and Nanoengineering, Aalto University, Espoo 02150, Finland;e-mail: pengli@nwpu.edu.cn;e-mail: jlzhao@nwpu.edu.cn

Xuan Cong;Hongxin Zeng;Shiqi Wang;Qiwu Shi;Shixiong Liang;Jiandong Sun;Sen Gong;Feng Lan;Ziqiang Yang;Yaxin Zhang-Terahertz Science and Technology Research Center, University of Electronic Science and Technology of China, Chengdu 610000, China;College of Materials Science and Engineering, Sichuan University, Chengdu 610065, China;National Key Laboratory of Application Specific Integrated Circuit, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou 215123, China;Yangtze Delta Region Institute (HuZhou), University of Electronic Science and Technology of China, Huzhou 313001, China

YU LI;XINHAO FAN;XUYUE GUO;YI ZHANG;SHENG LIU;BINGYAN WEI;DANDAN WEN;PENG LI;JIANLIN ZHAO-MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions,and Shaanxi Key Laboratory of Optical Information Technology,School of Physical Science and Technology,Northwestern Polytechnical University,Xi'an 710129,China;Xi'an Ming De Institute of Technology,Xi'an 710124,China;Department of Electronics and Nanoengineering,Aalto University,Espoo 02150,Finland

XUAN CONG;HONGXIN ZENG;SHIQI WANG;QIWU SHI;SHIXIONG LIANG;JIANDONG SUN;SEN GONG;FENG LAN;ZIQIANG YANG;YAXIN ZHANG-Terahertz Science and Technology Research Center,University of Electronic Science and Technology of China,Chengdu 610000,China;College of Materials Science and Engineering,Sichuan University,Chengdu 610065,China;National Key Laboratory of Application Specific Integrated Circuit,Hebei Semiconductor Research Institute,Shijiazhuang 050051,China;Key Laboratory of Nanodevices and Applications,Suzhou Institute of Nano-Tech and Nano-Bionics(SINANO),Chinese Academy of Sciences,Suzhou 215123,China;Yangtze Delta Region Institute(HuZhou),University of Electronic Science and Technology of China,Huzhou 313001,China