典型文献
Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test
文献摘要：
The insulated gate bipolar transistor(IGBT)module is one of the most age-affected components in the switch power supply,and its reliability prediction is con-ducive to timely troubleshooting and reduction in safety risks and unnecessary costs.The pulsed current pattern of the accelerator power supply is different from other con-verter applications;therefore,this study proposed a lifetime estimation method for IGBT modules in pulsed power supplies for accelerator magnets.The proposed methodol-ogy was based on junction temperature calculations using square-wave loss discretization and thermal modeling.Comparison results showed that the junction temperature error between the simulation and IR measurements was less than 3％.An AC power cycling test under real pulsed power supply applications was performed via offline wear-out monitoring of the tested power IGBT module.After combining the IGBT4 PC curve and fitting the test results,a simple corrected lifetime model was developed to quantitatively evaluate the lifetime of the IGBT module,which can be employed for the accelerator pulsed power supply in engineering.This method can be applied to other IGBT modules and pulsed power supplies.
文献关键词：
中图分类号：
作者姓名：
Jie Wang;Da-Qing Gao;Wan-Zeng Shen;Hong-Bin Yan
作者机构：
Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China;School of Nuclear Science and Technology,University of Chinese Academy of Sciences,Beijing 100049,China;School of Nuclear Science and Technology,Lanzhou University,Lanzhou 730000,China
文献出处：
引用格式：
[1]Jie Wang;Da-Qing Gao;Wan-Zeng Shen;Hong-Bin Yan-.Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test)[J].核技术（英文版）,2022(10):126-138
A类：
troubleshooting,methodol,IGBT4
B类：
Lifetime,estimation,using,square,wave,loss,discretization,power,cycling,insulated,gate,bipolar,transistor,most,age,affected,components,switch,supply,its,reliability,prediction,con,ducive,timely,reduction,safety,risks,unnecessary,costs,pulsed,current,pattern,accelerator,different,from,other,verter,applications,therefore,this,study,proposed,lifetime,modules,supplies,magnets,ogy,was,junction,temperature,calculations,thermal,modeling,Comparison,results,showed,that,error,between,simulation,measurements,less,than,An,AC,under,real,performed,via,offline,wear,out,monitoring,tested,After,combining,curve,fitting,simple,corrected,developed,quantitatively,evaluate,which,can,employed,engineering,This,applied
AB值：
0.521584
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