典型文献
Signal modeling and impulse response shaping for semiconductor detectors
文献摘要：
The output-signal models and impulse response shaping(IRS)functions of semiconductor detectors are important for establishing high-precision measurement systems.In this paper,an output-signal model for semi-conductor detector systems is proposed.According to the proposed model,a multistage cascade deconvolution IRS algorithm was developed using the C-R inverse system,R-C inverse system,and differentiator system.The silicon drift detector signals acquired from the analog-to-digital converter were tested.The experimental results indicated that the shaped pulses obtained using the proposed model had no undershoot,and the average peak base width of the output shaped pulses was reduced by 36％compared with that for a simple model proposed in a previous work[1].Offline processing results indicated that compared with the traditional IRS algorithm,the average peak base width of the output shaped pulses obtained using the proposed algorithm was reduced by 11％,and the total elapsed time required for pulse shaping was reduced by 26％.The proposed algorithm avoids recursive calculation.If the sampling frequency of the digital system reaches 100 MHz,the proposed algorithm can be simplified to integer arithmetic.The proposed IRS algorithm can be applied to high-resolution energy spectrum analysis,high-counting rate energy spectrum correction,and coincidence and anti-coincidence measurements.
文献关键词：
中图分类号：
作者姓名：
Xue-Yuan Wang;Jian-Bin Zhou;Ming Wang;Huai-Ping Wang;Xu Hong;Yi Liu;Ping Huang
作者机构：
College of Nuclear Technology and Automation Engineering,Chengdu University of Technology,Erxian Bridge,No.1 East 3 Road,Chenghua District,Chengdu 610059,China;Jiangxi Engineering Technology Research Center of Nuclear Geoscience Data Science and System,East China University of Technology,Nanchang 330013,China;China Testing Technology Co.,Ltd,Chengdu 610021,China
文献出处：
引用格式：
[1]Xue-Yuan Wang;Jian-Bin Zhou;Ming Wang;Huai-Ping Wang;Xu Hong;Yi Liu;Ping Huang-.Signal modeling and impulse response shaping for semiconductor detectors)[J].核技术（英文版）,2022(04):72-82
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AB值：
0.504975
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