典型文献
Experimental study on the accumulative effect of multiple pulses on acceleration sensor
文献摘要：
Intentional electromagnetic interference is a serious threat to the safety of electronic devices.Multiple electromagnetic pulses will be coupled and transmitted to electronic devices through the cables.Accumulative effects are generated,which make it easier for damage to occur in the electronic devices.In this article,the working principle of micro-silicon acceleration sensors is introduced.The accumulative effects of multiple pulses on acceleration sensors is studied by a large number of injection experiments.The accumulation trends of multiple pulses with different pulse numbers and intervals are analyzed.The damaged structures inside abnormal sensor amplifiers were observed via optical microscopy and scanning electron microscopy.The experimental results show that the accumulative effect is strength-ened with increased pulse number or decreased pulse interval,and the threshold voltage for multiple pulses on the acceleration sensor decreases.The threshold voltage for a single pulse is 321.57 V.When the pulse interval is 1 μs and the pulse number is 5,the threshold voltage for multiple pulses is 163.42 V,which is reduced by 49.12％compared with a single pulse.These results provide a reference for the damage design of electromagnetic pulse weapons.
文献关键词：
中图分类号：
作者姓名：
Jie Shen;Yong He;Xu-chao Pan;Zhong Fang;Hong Chen;Wan-li Zhang;Yun-lei Shi
作者机构：
School of Mechanical Engineering,Nanjing University of Science and Technology,Nanjing,210094,China;China Electronic Produce Reliability and Environmental Testing Research Institute,Guangzhou,510610,China
文献出处：
引用格式：
[1]Jie Shen;Yong He;Xu-chao Pan;Zhong Fang;Hong Chen;Wan-li Zhang;Yun-lei Shi-.Experimental study on the accumulative effect of multiple pulses on acceleration sensor)[J].防务技术,2022(05):772-780
A类：
Intentional
B类：
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AB值：
0.461809
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