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典型文献
Editorial for the Special Issue on High-End Measuring Instruments
文献摘要:
In recent years,two major challenges have arisen in the field of measurement and instrument technology.One is the redefinition of the seven basic units in the international system of units(Système International d'Unités or SI).The SI is now based on fun-damental physical constants,with full implementation having occurred in 2019.The other challenge is that a new round of scien-tific and technological revolution has led to breakthroughs in a new generation of information technology,biotechnology,new energy technology,new materials technology,and intelligent manu-facturing technology,especially in the high-end manufacturing industry.These breakthroughs are associated with the new era of digitalization,networking,and intelligence in which we live.The two challenges will inevitably lead to further development and use of the international measurement system,the measurement systems employed in various industrialized countries,and-inevi-tably-a new generation of better instrument technology that is more suited to the needs of industrial users.This new generation of instrumentation will require high-end measurement instru-ments that are more sophisticated and have greater capabilities to support the evolution of a new generation of practical national measurement systems.Such a shift will also profoundly affect the design,technical capabilities,and integration with information technology tools of high-end measurement instruments.
文献关键词:
作者姓名:
Jiubin Tan;Kenneth Thomas Victor Grattan
作者机构:
Key Laboratory of Ultra-Precision Intelligent Instrumentation,Ministry of Industry and Information Technology,Harbin Institute of Technology,Harbin 150080,China;School of Science&Technology,City University of London,London EC1V 0HB,UK
文献出处:
引用格式:
[1]Jiubin Tan;Kenneth Thomas Victor Grattan-.Editorial for the Special Issue on High-End Measuring Instruments)[J].工程(英文),2022(09):1-2
A类:
redefinition,Syst,inevi
B类:
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AB值:
0.528381
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