With the continuous development of science and technology, electronic devices have begun to enter all aspects of human life, becoming increasingly closely related to human life. Users have higher quality requirements for electronic devices. Electronic device testing has gradually become an irreplaceable engineering process in modern manufac- turing enterprises to guarantee the quality of products while preventing inferior products from entering the market. Considering the large output of electronic devices, improving the testing efficiency while reducing the testing cost has become an urgent problem to be solved. This study investigates the electronic device testing machine alloca- tion problem (EDTMAP), aiming to improve the production of electronic devices and reduce the scheduling distance among testing machines through reasonable machine allocation. First, a mathematical model was formulated for the EDTMAP to maximize both production and the scheduling distance among testing machines. Second, we developed a discrete multi-objective artificial bee colony (DMOABC) algorithm to solve EDTMAP. A crossover operator and local search operator were designed to improve the exploration and exploitation of the algorithm, respectively. Numeri- cal experiments were conducted to evaluate the performance of the proposed algorithm. The experimental results demonstrate the superiority of the proposed algorithm compared with the non-dominated sorting genetic algorithm Ⅱ(NSGA-II) and strength Pareto evolutionary algorithm 2 (SPEA2). Finally, the mathematical model and DMOABC algo-rithm were applied to a real-world factory that tests radio-frequency modules. The results verify that our method can significantly improve production and reduce the scheduling distance among testing machines.

Jin Xie;Xinyu Li;Liang Gao

State Key Laboratory of Digital Manufacturing Equipment and Technology,Huazhong University of Science and Technology,Wuhan 430074,China

中国机械工程学报

[1]Jin Xie;Xinyu Li;Liang Gao-.A Discrete Multi?Objective Artificial Bee Colony Algorithm for a Real?World Electronic Device Testing Machine Allocation Problem)[J].中国机械工程学报,2022(06):1-15

EDTMAP,DMOABC,Numeri

Discrete,Multi,Objective,Artificial,Bee,Colony,Algorithm,Real,World,Electronic,Device,Testing,Machine,Allocation,Problem,With,continuous,development,science,technology,electronic,devices,have,begun,aspects,human,life,becoming,increasingly,closely,related,Users,higher,quality,requirements,testing,has,gradually,become,irreplaceable,engineering,process,modern,manufac,turing,enterprises,guarantee,products,while,preventing,inferior,from,entering,market,Considering,large,output,improving,efficiency,reducing,cost,urgent,problem,solved,This,study,investigates,aiming,improve,production,reduce,scheduling,distance,among,machines,through,reasonable,allocation,First,mathematical,model,was,formulated,maximize,both,Second,developed,discrete,multi,objective,artificial,bee,colony,algorithm,crossover,operator,local,search,were,designed,exploration,exploitation,respectively,experiments,conducted,evaluate,performance,proposed,experimental,results,demonstrate,superiority,compared,dominated,sorting,genetic,NSGA,II,strength,Pareto,evolutionary,SPEA2,Finally,applied,real,world,factory,that,tests,radio,frequency,modules,verify,our,method,significantly

0.57856