Long Wen;Xianghong Nan;Jiaxiang Li;David R.S.Cumming;Xin Hu;Qin Chen-Institute of Nanophotonics,Jinan University,Guangzhou 511443,China;James Watt School of Engineering,University of Glasgow,Glasgow G128QQ,UK;Hangzhou Dianzi University,Hangzhou 310018,China

Arnaldo Leal-Junior;Leticia Avellar;Vitorino Biazi;M.Simone Soares;Anselmo Frizera;Carlos Marques-Graduate Program in Electrical Engineering,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;Mechanical Engineering Department,Federal University of Espírito Santo(UFES),Fernando Ferrari Avenue,Vitória 29075-910,Brazil;I3N&Physics Department,University of Aveiro,Aveiro 3810-193,Portugal

R.Y.Zhang;H.L.Qin;Z.N.Bi;Y.T.Tang;J.Araújo de Oliveira;T.L.Lee;C.Panwisawas;S.Y.Zhang;J.Zhang;J.Li;H.B.Dong-Centre of Excellence for Advanced Materials,Dongguan 523808,China;School of Engineering,University of Leicester,University Road,Leicester LEI 7RH,United Kingdom;Beijing Key Laboratory of Advanced High Temperature Materials,Central Iron and Steel Research Institute,Beijing 100081,China;Department of Materials,University of Oxford,Parks Road,Oxford OX1 3PH,United Kingdom;StressMap,Engineering and Innovation Department,The Open University,Walton Hall,Milton Keynes MK7 6AA,United Kingdom;ISIS Neutron Source,Rutherford Appleton Laboratory,Harwell Science and Innovation Campus,Chilton,Oxfordshire OX11 OQX,United Kingdom;School of Material Science and Engineering,Shanghai Jiao Tong University,Shanghai 200240,China

Eléonore Roussel;Christophe Szwaj;Clément Evain;Bernd Steffen;Christopher Gerth;Bahram Jalali;Serge Bielawski-Univ.Lille,CNRS,UMR 8523-PhLAM-Physique des Lasers,Atomes et Molécules,Centre d'(E)tude Recherches et Applications (CERLA),F-59000 Lille,France;DESY (Deutsches Elektronen-Synchrotron),Notkestr.85,D-22607 Hamburg,Germany;Electrical and Computer Engineering Department,University of California,Los Angeles,420 Westwood Plaza,90095 Los Angeles,CA.USA

Mohamed Touil;Sa?d Idlahcen;Rezki Becheker;Denis Lebrun;Claude Rozé;Ammar Hideur;Thomas Godin-CORIA,CNRS UMR6614—Université de Rouen Normandie—INSA Rouen,76800 Saint Etienne du Rouvray,France

Fanfei Meng;Aiping Yang;Kang Du;Fengyang Jia;Xinrui Lei;Ting Mei;Luping Du;Xiaocong Yuan-Nanophotonics Research Centre,Institute of Microscale Optoelectronics,Shenzhen University,518060 Shenzhen,China;MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions and Shaanxi Key Laboratory of Optical Information Technology,School of Physical Science and Technology,Northwestern Polytechnical University,710129 Xi'an,China

Rusnè lva?kevi?iūtè-Povilauskienè;Paulius Kizevi?ius;Ernestas Nacius;Domas Jokubauskis;K?stutis lkamas;Alvydas Lisauskas;Natalia Alexeeva;leva Matulaitienè;Vytautas Jukna;Sergej Orlov;Linas Minkevi?ius;Gintaras Valu?is-Department of Optoelectronics,Center for Physical Sciences and Technology,Sauletekio av.3,Vilnius 10257,Lithuania;Department of Fundamental Research,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Applied Electrodynamics&Telecommunications,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania;CENTERA Labs.,Institute of High Pressure Physics PAS,ul.Sokolowska 29/37,Warsaw 01-142,Poland;Department of Organic Chemistry,Center for Physical Sciences and Technology,Saulètekio av.3,Vilnius 10257,Lithuania;Institute of Photonics and Nanotechnology,Department of Physics,Vilnius University,Saulètekio av.3,Vilnius 10257,Lithuania

Zhaoqing Li;Olivier Allegre;Lin Li-Department of Mechanical,Aerospace and Civil Engineering,The University of Manchester,Manchester M13 9PL,UK

Liang HE;Yongcai SHEN;Hongming ZHANG;Bo LYU;Cheonho BAE;Huajiatnw JI;Chaoyang LI;Jia FU;Xuewei DU;Fudi WANG;Qiuping WANG;Xianghui YIN;Shunkuan WAN;Bin BIN;Yichao LI;Shuyu DAI-Institute of Plasma Physics,HFIPS,Chinese Academy of Sciences,Hefei 230031,People's Republic of China;University of Science and Technology of China,Hefei 230026,People's Republic of China;School of Physics and Materials Engineering,Hefei Normal University,Hefei 230601,People's Republic of China;Institute of Energy,Comprehensive National Science Center,Hefei 230026,People's Republic of China;School of Electrical Engineering,University of South of China,Hengyang 420001,People's Republic of China;Anhui Spectreation Instrument Co.Ltd,Hefei 230088,People's Republic of China;National Synchrotron Radiation Laboratory,University of Science and Technology of China,Hefei 230029,People's Republic of China;School of Physics,Dalian University of Technology,Dalian 116024,People's Republic of China

Aviv Karnieli;Yongyao Li;Ady Arie-Raymond and Beverly Sackler School of Physics and Astronomy,Tel Aviv University,Ramat Aviv 69978,Tel Aviv,Israel;School of Physics and Optoelectronic Engineering,Foshan University,Foshan 528000,China;School of Electrical Engineering,Fleischman Faculty of Engineering,Tel Aviv University,Tel Aviv,Israel

Bin Liu;Chunhua Zhang;Qin Lou;Hong Liang-Department of Physics,Hangzhou Dianzi University,Hangzhou 310018,China;Department of Mechanics and Aerospace Engineering,Southern University of Science and Technology,Shenzhen 518055,China;School of Energy and Power Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China

Si Jia Li;Zhuo Yue Li;Guo Shai Huang;Xiao Bin Liu;Rui Qi Li;Xiang Yu Cao-Information and Navigation College,Air Force Engineering University,Xi'an 710077,China;State Key Laboratory of Millimeter Waves,School of Information Science and Engineering,Southeast University,Nanjing 210096,China;Shaanxi Key Laboratory of Artificially-Structured Functional Materials and Devices,Air Force Engineering University,Xi'an 710051,China

Zhenkuan Chen;Shuiqin Zheng;Xiaoming Lu;Xinliang Wang;Yi Cai;Congying Wang;Maijie Zheng;Yuexia Ai;Yuxin Leng;Shixiang Xu;Dianyuan Fan-Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology,Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province,College of Physics and Optoelectronic Engineering,Shenzhen University,Guangzhou,China;SZU-NUS Collaborative Innovation Center for Optoelectronic Science&Technology,Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province,Shenzhen University,Guangzhou,China;Great Bay University,Dongguan,China;State Key Laboratory of High Field Laser Physics,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai,China

HE CHENG;POORIA GOLVARI;CHUN XIA;MINGMAN SUN;MENG ZHANG;STEPHEN M.KUEBLER;XIAOMING YU-CREOL,The College of Optics and Photonics,University of Central Florida,Orlando,Florida 32816,USA;Department of Chemistry,University of Central Florida,Orlando,Florida 32816,USA;Department of Industrial and Manufacturing Systems Engineering,Kansas State University,Manhattan,Kansas 66506,USA;Department of Material Science and Engineering,University of Central Florida,Orlando,Florida 32816,USA

TONGTONG KANG;BOYU FAN;JUN QIN;WEIHAO YANG;SHUANG XIA;ZHENG PENG;BO LIU;SUI PENG;XIAO LIANG;TINGTING TANG;LONGJIANG DENG;YI LUO;HANBIN WANG;QIANG ZHOU;LEI BI-National Engineering Research Center of Electromagnetic Radiation Control Materials,University of Electronic Science and Technology of China,Chengdu 610054,China;State Key Laboratory of Electronic Thin-Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China;Institute of Fundamental and Frontier Sciences,University of Electronic Science and Technology of China,Chengdu 610054,China;College of Optoelectronic Engineering,Chengdu University of Information Technology,Chengdu 610225,China;State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization,Panzhihua 617000,China;Microsystem&Terahertz Research Center,China Academy of Engineering Physics(CAEP),Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics(CAEP),Mianyang 621900,China

ZHOU ZHENG;ZHENGYING LI;XUELEI FU;XIN GUI-Hubei Key Laboratory of Broadband Wireless Communication and Sensor Networks,School of Information Engineering,Wuhan University of Technology,Wuhan 430070,China;National Engineering Laboratory for Fiber Optic Sensing Technology,Wuhan University of Technology,Wuhan 430070,China;State Key Laboratory of Silicate Materials for Architectures,Wuhan University of Technology,Wuhan 430070,China

XINJIAN LU;XIAOYIN LI;YINGHUI GUO;MINGBO PU;JIANGYU WANG;YAXIN ZHANG;XIONG LI;XIAOLIANG MA;XIANGANG LUO-State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering,Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu 610209,China;School of Optoelectronics,University of Chinese Academy of Sciences,Beijing 100049,China;Vector Light Field Research Center Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu 610209,China;School of Optoelectronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China

YANG ZHU;BINBIN LU;ZHIYUAN FAN;FUYONG YUE;XIAOFEI ZANG;ALEXEI V.BALAKIN;ALEXANDER P.SHKURINOV;YIMING ZHU;SONGLIN ZHUANG-Terahertz Technology Innovation Research Institute,Terahertz Spectrum and Imaging Technology Cooperative Innovation Center,Shanghai Key Laboratory of Modern Optical System,University of Shanghai for Science and Technology,Shanghai 200093,China;Shanghai Institute of Intelligent Science and Technology,Tongji University,Shanghai 200092,China;Department of Physics,Lomonosov Moscow State University,Moscow 119991,Russia

Jie Xu;Changjun Min;Yuquan Zhang;Jielei Ni;Gengwei Cao;Qianyi Wei;Jianjun Yang;Xiaocong Yuan-Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, China;State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China;e-mail: cjmin@szu.edu.cn;e-mail: yqzhang@szu.edu.cn;e-mail: xcyuan@szu.edu.cn

JIE XU;CHANGJUN MIN;YUQUAN ZHANG;JIELEI NI;GENGWEI CAO;QIANYI WEI;JIANJUN YANG;XIAOCONG YUAN-Nanophotonics Research Center,Shenzhen Key Laboratory of Micro-Scale Optical Information Technology&Institute of Microscale Optoelectronics,Shenzhen University,Shenzhen 518060,China;State Key Laboratory of Applied Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China