Yu-Lin Zhu;Bei-Lei Wu;Jing Li;Mu-Guang Wang;Shi-Ying Xiao;Feng-Ping Yan-Institute of Lightwave Technology,Key Laboratory of All Optical Network and Advanced Telecommunication of EMC,Beijing Jiaotong University,Beijing 100044,China

Anke Zhao;Ning Jiang;Jiafa Peng;Shiqin Liu;Yiqun Zhang;Kun Qiu-School of Information and Communication Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China

Eléonore Roussel;Christophe Szwaj;Clément Evain;Bernd Steffen;Christopher Gerth;Bahram Jalali;Serge Bielawski-Univ.Lille,CNRS,UMR 8523-PhLAM-Physique des Lasers,Atomes et Molécules,Centre d'(E)tude Recherches et Applications (CERLA),F-59000 Lille,France;DESY (Deutsches Elektronen-Synchrotron),Notkestr.85,D-22607 Hamburg,Germany;Electrical and Computer Engineering Department,University of California,Los Angeles,420 Westwood Plaza,90095 Los Angeles,CA.USA

Xin Ge Zhang;Ya Lun Sun;Bingcheng Zhu;Wei Xiang Jiang;Qian Yu;Han Wei Tian;Cheng-Wei Qiu;Zaichen Zhang;Tie Jun Cui-State Key Laboratory of Millimeter Waves,School of Information Science and Engineering,Southeast University,210096 Nanjing,China;National Mobile Communications Research Laboratory,School of Information Science and Engineering,Southeast University,210096 Nanjing,China;Frontiers Science Center for Mobile Information Communication and Security,Southeast University,210096 Nanjing,China;Purple Mountain Laboratories,211111 Nanjing,China;Department of Electrical and Computer Engineering,National University of Singapore,Singapore 117583,Singapore

Bangshan Sun;Fyodor Morozko;Patrick S.Salter;Simon Moser;Zhikai Pong;Raj B.Patel;Ian A.Walmsley;Mohan Wang;Adir Hazan;Nicolas Barré;Alexander Jesacher;Julian Fells;Chao He;Aviad Katiyi;Zhen-Nan Tian;Alina Karabchevsky;Martin J.Booth-Department of Engineering Science,University of Oxford,Oxford OX1 3PJ,UK;School of Electrical and Computer Engineering,Ben-Gurion University of the Negev,P.O.B.653,Beer-Sheva 8410501,Israel;Institute of Biomedical Physics,Medical University of Innsbruck,Müllerstra?e 44,6020 Innsbruck,Austria;Ultrafast Quantum Optics group,Department of Physics,Imperial College London,London,UK;Department of Physics,University of Oxford,Oxford,UK;Erlangen Graduate School in Advanced Optical Technologies(SAOT),Friedrich-Alexander-University Erlangen-Nurnberg,Paul-Gordan-Stra?e 6,91052 Erlangen,Germany;State Key Laboratory of Integrated Optoelectronics,College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

Xi Zhang;Zitong Feng;David Marpaung;Eric Numkam Fokoua;Hesham Sakr;John Richard Hayes;Francesco Poletti;David John Richardson;Radan Slavík-Optoelectronics Research Centre,University of Southampton,Southampton SO17 1BJ,UK;Laser Physics and Nonlinear Optics Group,Faculty of Science and Technology,MESA+Institute for Nanotechnology,University of Twente,Enschede 7500 AE,The Netherlands

Yanming LIU;Hailiang WEI;Lei SHI;Bo YAO-Key Laboratory of Information and Structure Efficiency in Extreme Environment,Ministry of Education of China,Xi'an 710071,People's Republic of China;School of Aerospace Science and Technology,Xidian University,Xi'an 710071,People's Republic of China

Qi-Ping Su;Yu Zhang;Liang Bin;Chui-Ping Yang-School of Physics,Hangzhou Normal University,Hangzhou 311121,China;School of Physics,Nanjing University,Nanjing 210093,China;Quantum Information Research Center,Shangrao Normal University,Shangrao 334001,China

ZHAO Zanshan;XING Weiguang;GAN Weiming-Haikou Lab,Institute of Acoustics,Chinese Academy of Sciences,Haikou 570100,China

SHI Changkun;XIA Zebin;Lü Peng;ZHANG Zengqi;XU Zongwei-State Key Laboratory of Precision Measuring Technology&Instruments,Tianjin University,Tianjin 300072,China

YISI DONG;PENG-CHENG HU;HAIJIN FU;HONGXING YANG;RUITAO YANG;JIUBIN TAN-Center of Ultra-precision Optoelectronic Instrument,Harbin Institute of Technology,Harbin 150080,China;Key Laboratory of Ultra-precision Intelligent Instrumentation(Harbin Institute of Technology),Ministry of Industry and Information Technology,Harbin 150080,China

ZIHAN ZHAO;YUE WANG;XUMIN DING;HAOYU LI;JIAHUI FU;KUANG ZHANG;SHAH NAWAZ BUROKUR;QUN WU-Advanced Microscopy and Instrumentation Research Center,School of Instrumentation Science and Engineering,Harbin Institute of Technology,Harbin 150080,China;Department of Microwave Engineering,Harbin Institute of Technology,Harbin 150001,China;LEME,UPL,Univ Paris Nanterre,F92410 Ville d'Avray,France

TONGTONG KANG;BOYU FAN;JUN QIN;WEIHAO YANG;SHUANG XIA;ZHENG PENG;BO LIU;SUI PENG;XIAO LIANG;TINGTING TANG;LONGJIANG DENG;YI LUO;HANBIN WANG;QIANG ZHOU;LEI BI-National Engineering Research Center of Electromagnetic Radiation Control Materials,University of Electronic Science and Technology of China,Chengdu 610054,China;State Key Laboratory of Electronic Thin-Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China;Institute of Fundamental and Frontier Sciences,University of Electronic Science and Technology of China,Chengdu 610054,China;College of Optoelectronic Engineering,Chengdu University of Information Technology,Chengdu 610225,China;State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization,Panzhihua 617000,China;Microsystem&Terahertz Research Center,China Academy of Engineering Physics(CAEP),Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics(CAEP),Mianyang 621900,China

BEICHEN WANG;ZIJIAO YANG;SHUMAN SUN;XU YI-Department of Electrical and Computer Engineering,University of Virginia,Charlottesville,Virginia 22904,USA;Department of Physics,University of Virginia,Charlottesville,Virginia 22904,USA

ZHOU ZHENG;ZHENGYING LI;XUELEI FU;XIN GUI-Hubei Key Laboratory of Broadband Wireless Communication and Sensor Networks,School of Information Engineering,Wuhan University of Technology,Wuhan 430070,China;National Engineering Laboratory for Fiber Optic Sensing Technology,Wuhan University of Technology,Wuhan 430070,China;State Key Laboratory of Silicate Materials for Architectures,Wuhan University of Technology,Wuhan 430070,China

YAQING JIN;YE YANG;HUIBO HONG;XIAO XIANG;RUNAI QUAN;TAO LIU;SHOUGANG ZHANG;NINGHUA ZHU;MING LI;RUIFANG DONG-Key Laboratory of Time and Frequency Primary Standards,National Time Service Center Chinese Academy of Sciences,Xi'an 710600,China;School of Astronomy and Space Science,University of Chinese Academy of Sciences,Beijing 100049,China;State Key Laboratory on Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;The 29th Research Institute of China Electronics Technology Group Corporation,Chengdu 610029,China;School of Electronic,Electrical and Communication Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100190,China

MOSHE KATZMAN;MAAYAN PRIEL;INBAR SHAFIR;SAAWAN KUMAR BAG;DVIR MUNK;NAOR INBAR;MOSHE FELDBERG;TALI SHARABANI;LEROY DOKHANIAN;MATAN SLOOK;AVI ZADOK-Faculty of Engineering,Bar-Ilan University,Ramat-Gan 5290002,Israel;Institute for Nano-Technology and Advanced Materials,Bar-Ilan University,Ramat-Gan 5290002,Israel;Soreq NRC,Yavne 81800,Israel;Tower Semiconductors,Migal Ha'Emek 2310502,Israel

Ting Wang;Ji-Liang Wu;Xu-Cheng Zhang;Yang Shi;Yue-De Yang;Jin-Long Xiao;Da-Ming Zhang;Guan-Shi Qin;Yong-Zhen Huang-State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China

TING WANG;JI-LIANG WU;XU-CHENG ZHANG;YANG SHI;YUE-DE YANG;JIN-LONG XIAO;DA-MING ZHANG;GUAN-SHI QIN;YONG-ZHEN HUANG-State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;State Key Laboratory of Integrated Optoelectronics,College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

Ye Yang;Yaqing Jin;Xiao Xiang;Tengfei Hao;Wei Li;Tao Liu;Shougang Zhang;Ninghua Zhu;Ruifang Dong;Ming Li-State Key Laboratory on Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;School of Electronic,Electrical and Communication Engineering,University of Chinese Academy of Sciences,Beijing 100049,China;Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences,Beijing 100190,China;Key Laboratory of Time and Frequency Primary Standards,National Time Service Center,Chinese Academy of Sciences,Xi'an 710600,China;School of Astronomy and Space Science,University of Chinese Academy of Sciences,Beijing 100049,China